AAAAAA
Results:
1-7
|
Results: 7
Authors:
Aqariden, F
Shih, HD
Turner, AM
Liao, PK
Citation: F. Aqariden et al., Defect reduction in Hg1-xCdxTe grown by molecular beam epitaxy on Cd0.96Zn0.04Te(211)B, J ELEC MAT, 30(6), 2001, pp. 794-796
Authors:
Aqariden, F
Shih, HD
Kinch, MA
Schaake, HF
Citation: F. Aqariden et al., Electrical properties of low-arsenic-doped HgCdTe grown by molecular beam epitaxy, APPL PHYS L, 78(22), 2001, pp. 3481-3483
Authors:
Aqariden, F
Shih, HD
Liao, PK
Duncan, WM
Dat, R
Citation: F. Aqariden et al., Real-time composition control using spectral ellipsometry in growth of Hg1-xCdxTe by molecular beam epitaxy, J VAC SCI B, 18(3), 2000, pp. 1381-1384
Authors:
Aqariden, F
Shih, HD
Turner, AM
Chandra, D
Liao, PK
Citation: F. Aqariden et al., Molecular beam epitaxial growth of HgCdTe on CdZnTe(311)B, J ELEC MAT, 29(6), 2000, pp. 727-728
Authors:
Shih, HD
Lin, YC
Huang, HC
Tzeng, KC
Hsu, ST
Citation: Hd. Shih et al., A DNA probe for identification of Xanthomonas campestris pv. campestris, the causal organism of black rot of crucifers in Taiwan, BOTAN B A S, 41(2), 2000, pp. 113-120
Authors:
Daraselia, M
Grein, CH
Rujirawat, S
Yang, B
Sivananthan, S
Aqariden, F
Shih, HD
Citation: M. Daraselia et al., In-situ monitoring of temperature and alloy composition of Hg1-xCdxTe using FTIR spectroscopic techniques, J ELEC MAT, 28(6), 1999, pp. 743-748
Authors:
Aqariden, F
Duncan, WM
Shih, HD
Almeida, LA
Bevan, MJ
Citation: F. Aqariden et al., Effect of incident angle in spectral ellipsometry on composition control during molecular beam epitaxial growth of HgCdTe, J ELEC MAT, 28(6), 1999, pp. 756-759
Risultati:
1-7
|