Authors:
Si, JJ
Ono, H
Uchida, K
Nozaki, S
Morisaki, H
Itoh, N
Citation: Jj. Si et al., Correlation between the dielectric constant and porosity of nanoporous silica thin films deposited by the gas evaporation technique, APPL PHYS L, 79(19), 2001, pp. 3140-3142
Citation: Jp. Liu et al., Photoluminescence properties of SiGe/Si single wells with fluctuating structural parameters, J PHYS D, 31(23), 1998, pp. L85-L87