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Results: 1-25/65
Authors:
Iglesias-Rubianes, L
Skeldon, P
Thompson, GE
Habazaki, H
Shimizu, K
Citation: L. Iglesias-rubianes et al., History effects in anodic oxidation of Al-W alloys, PHIL MAG A, 81(6), 2001, pp. 1579-1595
Authors:
Piekoszewski, J
Chmielewski, AG
Licki, J
Sartowska, B
Werner, Z
Barson, SD
Skeldon, P
Thompson, GE
Richter, E
Wieser, E
Cerny, I
Hnilica, F
Furbacher, I
Citation: J. Piekoszewski et al., Laboratory-unit investigations of palladium-treated titanium foil for dry scrubber application, RADIAT PH C, 62(2-3), 2001, pp. 253-260
Authors:
Gaponenko, NV
Sergeev, OV
Borisenko, VE
Pivin, JC
Skeldon, P
Thompson, GE
Hamilton, B
Misiewicz, J
Bryja, L
Kudrawiec, R
Stupak, AP
Stepanova, EA
Citation: Nv. Gaponenko et al., Terbium photoluminescence in polysiloxane films, MAT SCI E B, 81(1-3), 2001, pp. 191-193
Authors:
Shimizu, K
Habazaki, H
Skeldon, P
Thompson, GE
Marcus, RK
Citation: K. Shimizu et al., Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films, SURF INT AN, 31(9), 2001, pp. 869
Authors:
Bailey, P
Skeldon, P
Noakes, TCQ
Thompson, GE
Sakairi, M
Habazaki, H
Shimizu, K
Citation: P. Bailey et al., Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering, SURF INT AN, 31(6), 2001, pp. 480-483
Authors:
Ashitaka, Z
Thompson, GE
Skeldon, P
Habazaki, H
Shimizu, K
Citation: Z. Ashitaka et al., Behaviour of bismuth during simulated processing of model aluminium capacitor foils, J MATER SCI, 36(9), 2001, pp. 2237-2243
Authors:
Echeverria, F
Skeldon, P
Thompson, GE
Habazaki, H
Shimizu, K
Citation: F. Echeverria et al., Morphology and composition of layered anodic films on InP, J MATER SCI, 36(5), 2001, pp. 1253-1259
Authors:
Shimizu, K
Habazaki, H
Skeldon, P
Thompson, GE
Wood, GC
Citation: K. Shimizu et al., Migration of oxalate ions in anodic alumina, ELECTR ACT, 46(28), 2001, pp. 4379-4382
Authors:
Habazaki, H
Shimizu, K
Skeldon, P
Thompson, GE
Wood, GC
Citation: H. Habazaki et al., The behaviour of iron during anodic oxidation of sputtering-deposited Al-Fe alloys, CORROS SCI, 43(7), 2001, pp. 1393-1402
Authors:
Mato, S
Thompson, GE
Skeldon, P
Shimizu, K
Habazaki, H
Masheder, D
Citation: S. Mato et al., Enrichment of alloying elements beneath anodic oxides: investigation of Ta-1.5 at.% Cu alloy, CORROS SCI, 43(5), 2001, pp. 993-1002
Authors:
Shimizu, K
Brown, GM
Habazaki, H
Kobayashi, K
Skeldon, P
Thompson, GE
Wood, GC
Citation: K. Shimizu et al., Glow discharge optical emission spectroscopy - a powerful tool for the study of compositional non-uniformity in electrodeposited films, CORROS SCI, 43(2), 2001, pp. 199-205
Authors:
Iglesias-Rubianes, L
Skeldon, P
Thompson, GE
Shimizu, K
Habazaki, H
Citation: L. Iglesias-rubianes et al., Influence of current density in anodizing of an Al-W alloy, CORROS SCI, 43(12), 2001, pp. 2217-2227
Authors:
Liu, Y
Skeldon, P
Thompson, GE
Zhou, X
Habazaki, H
Shimizu, K
Citation: Y. Liu et al., Influence of surface treatment on detachment of anodic films from Al-Mg alloys, CORROS SCI, 43(12), 2001, pp. 2349-2357
Authors:
Pakes, A
Echeverria, F
Skeldon, P
Thompson, GE
Fraser, JW
McCaffrey, JP
Moisa, S
Graham, MJ
Habazaki, H
Shimizu, K
Citation: A. Pakes et al., Role of oxygen bubble generation in anodic film growth on InP, CORROS SCI, 43(11), 2001, pp. 2173-2184
Authors:
Habazaki, H
Takahiro, K
Yamaguchi, S
Shimizu, K
Skeldon, P
Thompson, GE
Wood, GC
Citation: H. Habazaki et al., Importance of amorphous-to-crystalline transitions for ionic transport andoxygen generation in anodic films, PHIL MAG A, 80(5), 2000, pp. 1027-1042
Authors:
Bouhanek, K
Adesanya, OA
Stott, FH
Skeldon, P
Lees, DG
Wood, GC
Citation: K. Bouhanek et al., Isothermal and thermal cyclic oxidation behaviour of thermal barrier coatings: Pt aluminide bond coats, MATER HIGH, 17(2), 2000, pp. 185-196
Authors:
Barson, SD
Skeldon, P
Thompson, GE
Kolitsch, A
Richter, E
Wieser, X
Piekoszewski, J
Chmielewski, AG
Werner, Z
Citation: Sd. Barson et al., Investigation of ion assisted palladium treatments for improved corrosion resistance of titanium foil in the electron beam dry scrubber process, SURF COAT, 127(2-3), 2000, pp. 179-192
Authors:
Shimizu, K
Habazaki, H
Skeldon, P
Thompson, GE
Wood, GC
Citation: K. Shimizu et al., GDOES depth profiling analysis of amorphous Ni-P-plated aluminium hard disks, SURF INT AN, 29(2), 2000, pp. 151-154
Authors:
Shimizu, K
Habazaki, H
Skeldon, P
Thompson, GE
Wood, GC
Citation: K. Shimizu et al., Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films, SURF INT AN, 29(2), 2000, pp. 155-159
Authors:
Shimizu, K
Habazaki, H
Skeldon, P
Thompson, GE
Citation: K. Shimizu et al., GDOES depth profiling analysis and cross-sectional transmission electron microscopy of a hard disk, SURF INT AN, 29(12), 2000, pp. 887-890
Authors:
Mato, S
Skeldon, P
Thompson, GE
Masheder, D
Sproule, GI
Graham, MJ
Habazaki, H
Shimizu, K
Citation: S. Mato et al., Behaviour of copper and generation of oxygen during anodizing of Nb-Cu alloys, SURF INT AN, 29(12), 2000, pp. 895-902
Authors:
Shimizu, K
Habazaki, H
Skeldon, P
Thompson, GE
Wood, GC
Citation: K. Shimizu et al., GDOES depth profiling analysis of the air-formed oxide film on a sputter-deposited Type 304 stainless steel, SURF INT AN, 29(11), 2000, pp. 743-746
Authors:
Echeverria, F
Skeldon, P
Thompson, GE
Habazaki, H
Shimizu, K
Citation: F. Echeverria et al., The formation of anodic oxides on InAs at high efficiency in sodium tungstate electrolyte, THIN SOL FI, 371(1-2), 2000, pp. 303-309
Authors:
Pires, I
Quintino, L
Rangel, CM
Thompson, GE
Skeldon, P
Zhou, X
Citation: I. Pires et al., Influence of pre-treatments on the surface condition of 2024-T3 aluminium alloy, T I MET FIN, 78, 2000, pp. 179-185
Authors:
Shimizu, K
Habazaki, H
Skeldon, P
Thompson, GE
Wood, GC
Citation: K. Shimizu et al., Migration of sulphate ions in anodic alumina, ELECTR ACT, 45(11), 2000, pp. 1805-1809