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Authors: Obolenskii, SV Skupov, VD

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Authors: Demidov, ES Latysheva, ND Perevoshchikov, VA Skupov, AV Skupov, VD

Citation: Es. Demidov et al., Effect of ion irradiation on the depth profiles of microdefects in silicon, INORG MATER, 36(5), 2000, pp. 422-425

Authors: Obolenskii, SV Skupov, VD Fefelov, AG

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Authors: Perevoshchikov, VA Skupov, VD

Citation: Va. Perevoshchikov et Vd. Skupov, Long-range gettering of microdefects in silicon single crystals during theformation of porous silicon layers on their surface and ion irradiation, TECH PHYS L, 25(4), 1999, pp. 315-316

Authors: Kiselev, VK Obolenskii, SV Skupov, VD

Citation: Vk. Kiselev et al., Influence of an internal getter in silicon on the parameters of Au-Si structures, TECH PHYS, 44(6), 1999, pp. 724-725