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Results: 1-25 | 26-38
Results: 1-25/38
Low cost nanolithography with nanoaccuracy
Authors: Smith, HI
Citation: Hi. Smith, Low cost nanolithography with nanoaccuracy, PHYSICA E, 11(2-3), 2001, pp. 104-109
Calculational study on membrane mask distortion and correction
Authors: Murooka, K Lim, MH Smith, HI
Citation: K. Murooka et al., Calculational study on membrane mask distortion and correction, J VAC SCI B, 19(4), 2001, pp. 1229-1234
100 nm gate hole openings for low voltage driving field emission display applications
Authors: Choi, JO Akinwande, AI Smith, HI
Citation: Jo. Choi et al., 100 nm gate hole openings for low voltage driving field emission display applications, J VAC SCI B, 19(3), 2001, pp. 900-903
Micromagnetic behavior of conical ferromagnetic particles
Authors: Ross, CA Farhoud, M Hwang, M Smith, HI Redjdal, M Humphrey, FB
Citation: Ca. Ross et al., Micromagnetic behavior of conical ferromagnetic particles, J APPL PHYS, 89(2), 2001, pp. 1310-1319
Magnetic properties and interactions of single-domain nanomagnets in a periodic array
Authors: Abraham, MC Schmidt, H Savas, TA Smith, HI Ross, CA Ram, RJ
Citation: Mc. Abraham et al., Magnetic properties and interactions of single-domain nanomagnets in a periodic array, J APPL PHYS, 89(10), 2001, pp. 5667-5670
Magnetic switching in 100 nm patterned pseudo spin valves
Authors: Castano, FJ Hao, Y Haratani, S Ross, CA Vogeli, B Walsh, M Smith, HI
Citation: Fj. Castano et al., Magnetic switching in 100 nm patterned pseudo spin valves, IEEE MAGNET, 37(4), 2001, pp. 2073-2075
Magnetization reversal in sub-100 nm pseudo-spin-valve element arrays
Authors: Castano, FJ Hao, Y Hwang, M Ross, CA Vogeli, B Smith, HI Haratani, S
Citation: Fj. Castano et al., Magnetization reversal in sub-100 nm pseudo-spin-valve element arrays, APPL PHYS L, 79(10), 2001, pp. 1504-1506
Oriented crystallization of GaSb on a patterned, amorphous Si substrate
Authors: Yi, SS Moran, PD Zhang, X Cerrina, F Carter, J Smith, HI Kuech, TF
Citation: Ss. Yi et al., Oriented crystallization of GaSb on a patterned, amorphous Si substrate, APPL PHYS L, 78(10), 2001, pp. 1358-1360
Dynamic three-dimensional mask-wafer positioning with nanometer exposure overlay
Authors: Moon, EE Meinhold, MW Everett, PN Smith, HI
Citation: Ee. Moon et al., Dynamic three-dimensional mask-wafer positioning with nanometer exposure overlay, JPN J A P 1, 39(12B), 2000, pp. 7040-7043
Lithographic patterning and confocal imaging with zone plates
Authors: Gil, D Menon, R Carter, DJD Smith, HI
Citation: D. Gil et al., Lithographic patterning and confocal imaging with zone plates, J VAC SCI B, 18(6), 2000, pp. 2881-2885
Membrane-mask distortion correction: Analytical and experimental results
Authors: Murooka, K Lim, MH Smith, HI
Citation: K. Murooka et al., Membrane-mask distortion correction: Analytical and experimental results, J VAC SCI B, 18(6), 2000, pp. 2966-2969
Two-dimensional spatial-phase-locked electron-beam lithography via sparse sampling
Authors: Hastings, JT Zhang, F Finlayson, MA Goodberlet, JG Smith, HI
Citation: Jt. Hastings et al., Two-dimensional spatial-phase-locked electron-beam lithography via sparse sampling, J VAC SCI B, 18(6), 2000, pp. 3268-3271
Characterization of field stitching in electron-beam lithography using moire metrology
Authors: Murphy, TE Mondol, MK Smith, HI
Citation: Te. Murphy et al., Characterization of field stitching in electron-beam lithography using moire metrology, J VAC SCI B, 18(6), 2000, pp. 3287-3291
Optimization of a lithographic and ion beam etching process for nanostructuring magnetoresistive thin film stacks
Authors: Walsh, ME Hao, YW Ross, CA Smith, HI
Citation: Me. Walsh et al., Optimization of a lithographic and ion beam etching process for nanostructuring magnetoresistive thin film stacks, J VAC SCI B, 18(6), 2000, pp. 3539-3543
He-atom diffraction from nanostructure transmission gratings: The role of imperfections - art. no. 033608
Authors: Grisenti, RE Schollkopf, W Toennies, JP Manson, JR Savas, TA Smith, HI
Citation: Re. Grisenti et al., He-atom diffraction from nanostructure transmission gratings: The role of imperfections - art. no. 033608, PHYS REV A, 6103(3), 2000, pp. 3608
Fabrication of patterned media for high density magnetic storage
Authors: Ross, CA Smith, HI Savas, T Schattenburg, M Farhoud, M Hwang, M Walsh, M Abraham, MC Ram, RJ
Citation: Ca. Ross et al., Fabrication of patterned media for high density magnetic storage, MICROEL ENG, 53(1-4), 2000, pp. 67-67
Soft x-rays for deep sub-100 nm lithography, with and without masks
Authors: Smith, HI Carter, DJD Meinhold, M Moon, EE Lim, MH Ferrera, J Walsh, M Gil, D Menon, R
Citation: Hi. Smith et al., Soft x-rays for deep sub-100 nm lithography, with and without masks, MICROEL ENG, 53(1-4), 2000, pp. 77-84
Incoherent magnetization reversal in 30-nm Ni particles
Authors: Ross, CA Chantrell, R Hwang, M Farhoud, M Savas, TA Hao, Y Smith, HI Ross, FM Redjdal, M Humphrey, FB
Citation: Ca. Ross et al., Incoherent magnetization reversal in 30-nm Ni particles, PHYS REV B, 62(21), 2000, pp. 14252-14258
Magnetic force microscopy study of interactions in 100 nm period nanomagnet arrays
Authors: Hwang, M Abraham, MC Savas, TA Smith, HI Ram, RJ Ross, CA
Citation: M. Hwang et al., Magnetic force microscopy study of interactions in 100 nm period nanomagnet arrays, J APPL PHYS, 87(9), 2000, pp. 5108-5110
The effect of aspect ratio on the magnetic anisotropy of particle arrays
Authors: Farhoud, M Smith, HI Hwang, M Ross, CA
Citation: M. Farhoud et al., The effect of aspect ratio on the magnetic anisotropy of particle arrays, J APPL PHYS, 87(9), 2000, pp. 5120-5122
In-plane anisotropy in arrays of magnetic ellipses
Authors: Hao, Y Walsh, M Farhoud, M Ross, CA Smith, HI Wang, JQ Malkinski, L
Citation: Y. Hao et al., In-plane anisotropy in arrays of magnetic ellipses, IEEE MAGNET, 36(5), 2000, pp. 2996-2998
Major hysteresis loop modeling of two-dimensional arrays of single domain particles
Authors: Hwang, M Farhoud, M Hao, Y Walsh, M Savas, TA Smith, HI Ross, CA
Citation: M. Hwang et al., Major hysteresis loop modeling of two-dimensional arrays of single domain particles, IEEE MAGNET, 36(5), 2000, pp. 3173-3175
Sub-100 nm metrology using interferometrically produced fiducials
Authors: Schattenburg, ML Chen, C Everett, PN Ferrera, J Konkola, P Smith, HI
Citation: Ml. Schattenburg et al., Sub-100 nm metrology using interferometrically produced fiducials, J VAC SCI B, 17(6), 1999, pp. 2692-2697
Novel mask-wafer gap measurement scheme with nanometer-level detectivity
Authors: Moon, EE Everett, PN Meinhold, MW Mondol, MK Smith, HI
Citation: Ee. Moon et al., Novel mask-wafer gap measurement scheme with nanometer-level detectivity, J VAC SCI B, 17(6), 1999, pp. 2698-2702
A holographic phase-shifting interferometer technique to measure in-plane distortion
Authors: Lim, MH Ferrera, J Pipe, KP Smith, HI
Citation: Mh. Lim et al., A holographic phase-shifting interferometer technique to measure in-plane distortion, J VAC SCI B, 17(6), 1999, pp. 2703-2706
Risultati: 1-25 | 26-38