Authors: MacDowell, AA Celestre, RS Tamura, N Spolenak, R Valek, B Brown, WL Bravman, JC Padmore, HA Batterman, BW Patel, JR

Citation: Aa. Macdowell et al., Submicron X-ray diffraction, NUCL INST A, 467, 2001, pp. 936-943

Authors: Wei, BQ Kohler-Redlich, P Bader, U Heiland, B Spolenak, R Arzt, E Ruhle, M

Citation: Bq. Wei et al., Selective specimen preparation for TEM observation of the cross-section ofindividual carbon nanotube/metal junctions, ULTRAMICROS, 85(2), 2000, pp. 93-98

Authors: Spolenak, R Heiland, B Witt, C Keller, RM Mullner, P Arzt, E

Citation: R. Spolenak et al., The preparation of TEM-specimens using Focused Ion Beam (FIB) systems, PRAKT METAL, 37(2), 2000, pp. 90-101

Authors: Marien, J Plitzko, JM Spolenak, R Keller, RM Mayer, J

Citation: J. Marien et al., Quantitative electron spectroscopic imaging studies of microelectronic metallization layers, J MICROSC O, 194, 1999, pp. 71-78

Authors: Wei, BQ Spolenak, R Kohler-Redlich, P Ruhle, M Arzt, E

Citation: Bq. Wei et al., Electrical transport in pure and boron-doped carbon nanotubes, APPL PHYS L, 74(21), 1999, pp. 3149-3151