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Results: 1-8 |
Results: 8
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures
Authors: Bychikhin, S Litzenberger, M Pichler, R Pogany, D Gornik, E Groos, G Stecher, M
Citation: S. Bychikhin et al., Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures, MICROEL REL, 41(9-10), 2001, pp. 1501-1506
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology
Authors: Gossner, H Muller-Lynch, T Esmark, K Stecher, M
Citation: H. Gossner et al., Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology, MICROEL REL, 41(3), 2001, pp. 385-393
Interferometric temperature mapping during ESD stress and failure analysisof smart power technology ESD protection devices
Authors: Furbock, C Pogany, D Litzenberger, M Gornik, E Seliger, N Gossner, H Muller-Lynch, T Stecher, M Werner, W
Citation: C. Furbock et al., Interferometric temperature mapping during ESD stress and failure analysisof smart power technology ESD protection devices, J ELECTROST, 49(3-4), 2000, pp. 195-213
Thermal and free carrier concentration mapping during ESD event in Smart Power ESD protection devices using an improved laser interferometric technique
Authors: Furbock, C Esmark, K Litzenberger, M Pogany, D Groos, G Zelsacher, R Stecher, M Gornik, E
Citation: C. Furbock et al., Thermal and free carrier concentration mapping during ESD event in Smart Power ESD protection devices using an improved laser interferometric technique, MICROEL REL, 40(8-10), 2000, pp. 1365-1370
Random telegraph noise and leakage current in smart power technology DMOS devices
Authors: Pogany, D Gornik, E Stecher, M Werner, W
Citation: D. Pogany et al., Random telegraph noise and leakage current in smart power technology DMOS devices, MICROEL REL, 40(11), 2000, pp. 1887-1890
Reproductive potential of gamma-irradiated males of the meadow grasshopperChorthippus parallelus (Zetterstedt) (Orth., Acrididae)
Authors: Reinhardt, K Fuller, J Kohler, G Stecher, M
Citation: K. Reinhardt et al., Reproductive potential of gamma-irradiated males of the meadow grasshopperChorthippus parallelus (Zetterstedt) (Orth., Acrididae), J APPL ENT, 123(9), 1999, pp. 519-523
Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress
Authors: Furbock, C Litzenberger, M Pogany, D Gornik, E Seliger, N Muller-Lynch, T Stecher, M Gossner, H Werner, W
Citation: C. Furbock et al., Laser interferometric method for ns-time scale thermal mapping of Smart Power ESD protection devices during ESD stress, MICROEL REL, 39(6-7), 1999, pp. 925-930
Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices
Authors: Pogany, D Seliger, N Litzenberger, M Gossner, H Stecher, M Muller-Lynch, T Werner, W Gornik, E
Citation: D. Pogany et al., Damage analysis in smart-power technology electrostatic discharge (ESD) protection devices, MICROEL REL, 39(6-7), 1999, pp. 1143-1148
Risultati: 1-8 |