Authors:
Mchedlidze, T
Matsumoto, K
Lin, TC
Suezawa, M
Citation: T. Mchedlidze et al., Dependence of electrically detected magnetic resonance signal shape from iron-contaminated silicon wafers on the thermal treatment of the samples, PHYSICA B, 274, 1999, pp. 404-407
Citation: N. Fukata et M. Suezawa, Formation energy of self-interstitials in carbon-doped Si determined by optical absorption due to hydrogen bound to self-interstitials, J APPL PHYS, 86(4), 1999, pp. 1848-1853
Citation: M. Suezawa et R. Mori, Optical absorption study of the interaction between group II acceptors andhydrogen in Si, PHYS ST S-B, 210(2), 1998, pp. 507-511