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HUNT CE
MALINOWSKI ME
FELTER TE
TALIN AA
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WILLIAMS RS
TALIN AA
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GOORSKY MS
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SEGAWA Y
Citation: Ba. Morgan et al., ROLE OF INTERFACE MICROSTRUCTURE IN RECTIFYING METAL SEMICONDUCTOR CONTACTS - BALLISTIC-ELECTRON-EMISSION OBSERVATIONS CORRELATED TO MICROSTRUCTURE/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1238-1242
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BI WG
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RING KM
KAVANAGH KL
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WILLIAMS RS
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MCCARTY KF
FELTER TE
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BUNSHAH RF
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MEYER R
BAPTIST R
FELTER TE
TALIN AA
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Citation: Aa. Talin et al., LATERAL VARIATION IN THE SCHOTTKY-BARRIER HEIGHT OF AU PTSI/(100)SI DIODES/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(4), 1994, pp. 2634-2638
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WILLIAMS RS
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WILLIAMS B
KAVANAGH KL
Citation: Aa. Talin et al., TIME-DEPENDENT BALLISTIC-ELECTRON-EMISSION MICROSCOPY STUDIES OF A AU(100)GAAS INTERFACE WITH A NATIVE-OXIDE DIFFUSION BARRIER (VOL 62, PG2965, 1993)/, Applied physics letters, 64(4), 1994, pp. 529-529
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OHLBERG DAA
WILLIAMS RS
SULLIVAN P
KOUTSELAS I
WILLIAMS B
KAVANAGH KL
Citation: Aa. Talin et al., TIME-DEPENDENT BALLISTIC ELECTRON-EMISSION MICROSCOPY STUDIES OF A AU(100)GAAS INTERFACE WITH A NATIVE-OXIDE DIFFUSION BARRIER/, Applied physics letters, 62(23), 1993, pp. 2965-2966