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MACKAY JF
TEICHERT C
SAVAGE DE
LAGALLY MG
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TEICHERT C
MACKAY JF
SAVAGE DE
LAGALLY MG
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Citation: C. Teichert et al., COMPARISON OF SURFACE-ROUGHNESS OF POLISHED SILICON-WAFERS MEASURED BY LIGHT-SCATTERING TOPOGRAPHY, SOFT-X-RAY SCATTERING, AND ATOMIC-FORCEMICROSCOPY, Applied physics letters, 66(18), 1995, pp. 2346-2348
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Authors:
PHANG YH
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LAGALLY MG
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Citation: T. Michely et C. Teichert, ADATOM YIELDS, SPUTTERING YIELDS, AND DAMAGE PATTERNS OF SINGLE-ION IMPACTS ON PT(111), Physical review. B, Condensed matter, 50(15), 1994, pp. 11156-11166
Citation: T. Michely et C. Teichert, ADATOM YIELDS, SPUTTERING YIELDS, AND DAMAGE PATTERNS OF SINGLE-ION IMPACTS ON PT(111), Physical review. B, Condensed matter, 50(15), 1994, pp. 11156-11166
Citation: C. Teichert et al., NUCLEI OF THE PT(111) NETWORK RECONSTRUCTION CREATED BY SINGLE-ION IMPACTS, Physical review letters, 72(11), 1994, pp. 1682-1685
Citation: C. Teichert et al., STEP FORMATION ON THE ION-BOMBARDED AG(100) SURFACE STUDIED BY LEED AND MONTE-CARLO SIMULATIONS, Physica status solidi. a, Applied research, 146(1), 1994, pp. 223-242
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SERVATY R
TEICHERT C
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Citation: G. Rosenfeld et al., LAYER-BY-LAYER GROWTH OF AG ON AG(111) INDUCED BY ENHANCED NUCLEATION- A MODEL STUDY FOR SURFACTANT-MEDIATED GROWTH, Physical review letters, 71(6), 1993, pp. 895-898