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Results: 1-12 |
Results: 12
HIGHLY ACCURATE NONCONTACT CHARACTERIZATION OF ENGINEERING SURFACES USING CONFOCAL MICROSCOPY
Authors: JORDAN HJ WEGNER M TIZIANI H
Citation: Hj. Jordan et al., HIGHLY ACCURATE NONCONTACT CHARACTERIZATION OF ENGINEERING SURFACES USING CONFOCAL MICROSCOPY, Measurement science & technology, 9(7), 1998, pp. 1142-1151
LOW-COHERENCE FIBER HETERODYNE INTERFEROMETER FOR BOTH DC AND HIGH-FREQUENCY VIBRATION MEASUREMENTS IN THE INNER-EAR
Authors: DALHOFF E GARTNER R HOFBAUER U TIZIANI H ZENNER HP GUMMER AW
Citation: E. Dalhoff et al., LOW-COHERENCE FIBER HETERODYNE INTERFEROMETER FOR BOTH DC AND HIGH-FREQUENCY VIBRATION MEASUREMENTS IN THE INNER-EAR, J. mod. opt., 45(4), 1998, pp. 765-775
BORN APPROXIMATION FOR THE NONPARAXIAL SCALAR TREATMENT OF THICK PHASE GRATINGS
Authors: SINGER W TIZIANI H
Citation: W. Singer et H. Tiziani, BORN APPROXIMATION FOR THE NONPARAXIAL SCALAR TREATMENT OF THICK PHASE GRATINGS, Applied optics, 37(7), 1998, pp. 1249-1255
DEVELOPMENT OF A NARROW WATER-IMMERSION OBJECTIVE FOR LASERINTERFEROMETRIC AND ELECTROPHYSIOLOGICAL APPLICATIONS IN CELL BIOLOGY
Authors: MAIER H ZINN C ROTHE A TIZIANI H GUMMER AW
Citation: H. Maier et al., DEVELOPMENT OF A NARROW WATER-IMMERSION OBJECTIVE FOR LASERINTERFEROMETRIC AND ELECTROPHYSIOLOGICAL APPLICATIONS IN CELL BIOLOGY, Journal of neuroscience methods, 77(1), 1997, pp. 31-41
2-WAVELENGTH CONTOURING WITH A PULSED RUBY-LASER BY EMPLOYING TV-HOLOGRAPHY
Authors: ZOU YL PEDRINI G TIZIANI H
Citation: Yl. Zou et al., 2-WAVELENGTH CONTOURING WITH A PULSED RUBY-LASER BY EMPLOYING TV-HOLOGRAPHY, J. mod. opt., 43(3), 1996, pp. 639-646
SURFACE CONTOURING IN A VIDEO FRAME BY CHANGING THE WAVELENGTH OF A DIODE-LASER
Authors: ZOU YL PEDRINI G TIZIANI H
Citation: Yl. Zou et al., SURFACE CONTOURING IN A VIDEO FRAME BY CHANGING THE WAVELENGTH OF A DIODE-LASER, Optical engineering, 35(4), 1996, pp. 1074-1079
OVERCOMING COHERENCE LENGTH LIMITATION IN 2 WAVELENGTH INTERFEROMETRY- AN EXPERIMENTAL-VERIFICATION
Authors: FISCHER E DALHOFF E TIZIANI H
Citation: E. Fischer et al., OVERCOMING COHERENCE LENGTH LIMITATION IN 2 WAVELENGTH INTERFEROMETRY- AN EXPERIMENTAL-VERIFICATION, Optics communications, 123(4-6), 1996, pp. 465-472
BINARY GRATINGS FOR CO2 LASER-BEAM DIAGNOSTICS
Authors: HEMBDSOLLNER C BUDZINSKI C TIZIANI H
Citation: C. Hembdsollner et al., BINARY GRATINGS FOR CO2 LASER-BEAM DIAGNOSTICS, Applied optics, 35(19), 1996, pp. 3662-3670
A COMBINED DISTANCE AND SURFACE PROFILE MEASUREMENT SYSTEM FOR INDUSTRIAL APPLICATIONS - A EUROPEAN PROJECT
Authors: DOCCHIO F PERINI U TIZIANI H
Citation: F. Docchio et al., A COMBINED DISTANCE AND SURFACE PROFILE MEASUREMENT SYSTEM FOR INDUSTRIAL APPLICATIONS - A EUROPEAN PROJECT, Measurement science & technology, 5(7), 1994, pp. 807-815
CONTOURING BY ELECTRONIC SPECKLE PATTERN INTERFEROMETRY EMPLOYING DIVERGENT DUAL-BEAM ILLUMINATION
Authors: ZOU Y PEDRINI G TIZIANI H
Citation: Y. Zou et al., CONTOURING BY ELECTRONIC SPECKLE PATTERN INTERFEROMETRY EMPLOYING DIVERGENT DUAL-BEAM ILLUMINATION, J. mod. opt., 41(8), 1994, pp. 1637-1652
DERIVATIVES OBTAINED DIRECTLY FROM DISPLACEMENT DATA
Authors: ZOU Y PEDRINI G TIZIANI H
Citation: Y. Zou et al., DERIVATIVES OBTAINED DIRECTLY FROM DISPLACEMENT DATA, Optics communications, 111(5-6), 1994, pp. 427-432
2-WAVELENGTH DSPI SURFACE CONTOURING THROUGH THE TEMPERATURE MODULATION OF A LASER-DIODE
Authors: ZOU Y PENG X TIZIANI H
Citation: Y. Zou et al., 2-WAVELENGTH DSPI SURFACE CONTOURING THROUGH THE TEMPERATURE MODULATION OF A LASER-DIODE, Optik, 94(4), 1993, pp. 155-158
Risultati: 1-12 |