Authors: DUVANOV SM KOBZEV AP TOLOPA AM SHIROKOV DM

Citation: Sm. Duvanov et al., INVESTIGATION OF THE ELEMENTS DEPTH PROFILES IN SURFACE-LAYERS OF GLASS MODIFIED BY ION-BEAM-ASSISTED DEPOSITION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 264-267

Authors: TOLOPA AM

Citation: Am. Tolopa, TAMEK - SOURCES AND TECHNIQUES FOR HIGH-DOSE IMPLANTATION, ION-BEAM MIXING, AND ION-BEAM-ASSISTED DEPOSITION OF METAL-IONS, Review of scientific instruments, 65(4), 1994, pp. 1322-1324

Authors: TOLOPA AM

Citation: Am. Tolopa, DEVELOPMENT OF TAMEK AND OTHER VACUUM-ARC ION SOURCES, Review of scientific instruments, 65(10), 1994, pp. 3134-3139