Citation: S. Kordic et al., CORRELATION BETWEEN STRESS VOIDING OF AL(SI)(CU) METALLIZATIONS AND CRYSTAL ORIENTATION OF ALUMINUM GRAINS, Journal of applied physics, 74(9), 1993, pp. 5391-5394
Citation: Kz. Troost, ASSESSMENT OF IMPLANTATION DAMAGE BY BACKSCATTER KIKUCHI DIFFRACTION IN THE SCANNING ELECTRON-MICROSCOPE, Applied physics letters, 63(7), 1993, pp. 958-960