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Results:
1-7
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Results: 7
Authors:
Bryson, CE
Vasilyev, L
Linder, R
White, RL
Thiele, JU
Coffey, KR
Brannon, JH
Citation: Ce. Bryson et al., Measurement of carbon film thickness by inelastic electron scatter, J VAC SCI A, 19(5), 2001, pp. 2695-2697
Authors:
Thiele, JU
Best, ME
Toney, MF
Weller, D
Citation: Ju. Thiele et al., Grain size control in FePt thin films by Ar-ion etched Pt seed layers, IEEE MAGNET, 37(4), 2001, pp. 1271-1273
Authors:
Yen, BK
Thiele, JU
Geisler, M
Kasai, PH
White, RL
York, BR
Zadoori, H
Kellock, AJ
Tang, WC
Wu, TW
Toney, MF
Marchon, B
Citation: Bk. Yen et al., Effect of N doping on structure and properties of DLC films produced by plasma beam deposition, IEEE MAGNET, 37(4), 2001, pp. 1786-1788
Authors:
Chambers, SA
Thevuthasan, S
Farrow, RFC
Marks, RF
Thiele, JU
Folks, L
Samant, MG
Kellock, AJ
Ruzycki, N
Ederer, DL
Diebold, U
Citation: Sa. Chambers et al., Epitaxial growth and properties of ferromagnetic co-doped TiO2 anatase, APPL PHYS L, 79(21), 2001, pp. 3467-3469
Authors:
Schwickert, MM
Hannibal, KA
Toney, MF
Best, M
Folks, L
Thiele, JU
Kellock, AJ
Weller, D
Citation: Mm. Schwickert et al., Temperature dependent chemical ordering in FePt(001) and FePt(110) films, J APPL PHYS, 87(9), 2000, pp. 6956-6958
Authors:
Thiele, JU
Pocker, DJ
White, RL
Citation: Ju. Thiele et al., Interface reactions between quaternary cobalt alloys and carbon coating inthin film disk media, J APPL PHYS, 87(6), 2000, pp. 2989-2993
Authors:
Weller, D
Moser, A
Folks, L
Best, ME
Lee, W
Toney, MF
Schwickert, M
Thiele, JU
Doerner, MF
Citation: D. Weller et al., High K-u materials approach to 100 Gbits/in(2), IEEE MAGNET, 36(1), 2000, pp. 10-15
Risultati:
1-7
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