AAAAAA
Results:
1-16
|
Results: 16
Authors:
Prange, W
Kurbjuhn, T
Tolan, M
Press, W
Citation: W. Prange et al., The structure of hexane/perfluorohexane thin liquid films, J PHYS-COND, 13(21), 2001, pp. 4957-4972
Authors:
Tolan, M
Seydel, T
Madsen, A
Grubel, G
Press, W
Sinha, SK
Citation: M. Tolan et al., Investigation of surface dynamics on micro- and nanometer scales, APPL SURF S, 182(3-4), 2001, pp. 236-243
Authors:
Seydel, T
Madsen, A
Tolan, M
Grubel, G
Press, W
Citation: T. Seydel et al., Capillary waves in slow motion - art. no. 073409, PHYS REV B, 6307(7), 2001, pp. 3409
Authors:
Shin, K
Pu, Y
Rafailovich, MH
Sokolov, J
Seeck, OH
Sinha, SK
Tolan, M
Kolb, R
Citation: K. Shin et al., Correlated surfaces of free-standing polystyrene thin films, MACROMOLEC, 34(16), 2001, pp. 5620-5626
Authors:
Tolan, M
Seeck, OH
Wang, J
Sinha, SK
Refailovich, MH
Sokolov, J
Citation: M. Tolan et al., X-ray scattering from polymer films, PHYSICA B, 283(1-3), 2000, pp. 22-26
Authors:
Doerr, AK
Tolan, M
Schlomka, JP
Press, W
Citation: Ak. Doerr et al., Evidence for density anomalies of liquids at the solid/liquid interface, EUROPH LETT, 52(3), 2000, pp. 330-336
Authors:
Zimmermann, KM
Tolan, M
Weber, R
Stettner, J
Doerr, AK
Press, W
Citation: Km. Zimmermann et al., Phase determination of x-ray reflection coefficients, PHYS REV B, 62(15), 2000, pp. 10377-10382
Authors:
Kaendler, ID
Seeck, OH
Schlomka, JP
Tolan, M
Press, W
Stettner, J
Kappius, L
Dieker, C
Mantl, S
Citation: Id. Kaendler et al., Structural characterization of oxidized allotaxially grown CoSi2 layers byx-ray scattering, J APPL PHYS, 87(1), 2000, pp. 133-139
Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method
Authors:
Seeck, OH
Kaendler, ID
Tolan, M
Shin, K
Rafailovich, MH
Sokolov, J
Kolb, R
Citation: Oh. Seeck et al., Analysis of x-ray reflectivity data from low-contrast polymer bilayer systems using a Fourier method, APPL PHYS L, 76(19), 2000, pp. 2713-2715
Authors:
Schlomka, JP
Tolan, M
Press, W
Citation: Jp. Schlomka et al., In situ growth study of NiMnSb films on MgO(001) and Si(001), APPL PHYS L, 76(15), 2000, pp. 2005-2007
Authors:
Seeck, OH
Hupfeld, D
Krull, H
Doerr, AK
Schlomka, JP
Tolan, M
Press, W
Citation: Oh. Seeck et al., Surface phase transition close to a bulk tricritical point: An x-ray studyof ND4Cl, PHYS REV B, 59(5), 1999, pp. 3474-3479
Authors:
Schwedhelm, R
Schlomka, JP
Woedtke, S
Adelung, R
Kipp, L
Tolan, M
Press, W
Skibowski, M
Citation: R. Schwedhelm et al., Epitaxial thin-film growth of C-60 on VSe2 studied with scanning tunnelingmicroscopy and x-ray diffraction, PHYS REV B, 59(20), 1999, pp. 13394-13400
Authors:
Wang, J
Tolan, M
Seeck, OH
Sinha, SK
Bahr, O
Rafailovich, MH
Sokolov, J
Citation: J. Wang et al., Surfaces of strongly confined polymer thin films studied by X-ray scattering, PHYS REV L, 83(3), 1999, pp. 564-567
Authors:
Doerr, AK
Tolan, M
Prange, W
Schlomka, JP
Seydel, T
Press, W
Smilgies, D
Struth, B
Citation: Ak. Doerr et al., Observation of capillary waves on liquid thin films from mesoscopic to atomic length scales, PHYS REV L, 83(17), 1999, pp. 3470-3473
Authors:
Schlomka, JP
Tolan, M
Press, W
Fitzsimmons, MR
Siebrecht, R
Schubert, DW
Simon, P
Citation: Jp. Schlomka et al., Interdiffusion in NiMnSb/V/NiMnSb: X-ray and neutron reflectivity investigation of ion beam sputtered trilayer systems, J APPL PHYS, 86(9), 1999, pp. 5146-5151
Authors:
Waterworth, PD
Dunning, J
Tolan, M
Cozzi, E
Langford, G
Chavez, G
White, D
Wallwork, J
Citation: Pd. Waterworth et al., Life-supporting pig-to-baboon heart xenotransplantation, J HEART LUN, 17(12), 1998, pp. 1201-1207
Risultati:
1-16
|