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Results: 1-21 |
Results: 21
Oxygen-enhanced IrMn spin valves deposited by ion-beam and magnetron sputtering
Authors: Lee, WY Carey, M Toney, MF Rice, P Gurney, B Chang, HC Allen, E Mauri, D
Citation: Wy. Lee et al., Oxygen-enhanced IrMn spin valves deposited by ion-beam and magnetron sputtering, J APPL PHYS, 89(11), 2001, pp. 6925-6927
Grain size control in FePt thin films by Ar-ion etched Pt seed layers
Authors: Thiele, JU Best, ME Toney, MF Weller, D
Citation: Ju. Thiele et al., Grain size control in FePt thin films by Ar-ion etched Pt seed layers, IEEE MAGNET, 37(4), 2001, pp. 1271-1273
Effect of N doping on structure and properties of DLC films produced by plasma beam deposition
Authors: Yen, BK Thiele, JU Geisler, M Kasai, PH White, RL York, BR Zadoori, H Kellock, AJ Tang, WC Wu, TW Toney, MF Marchon, B
Citation: Bk. Yen et al., Effect of N doping on structure and properties of DLC films produced by plasma beam deposition, IEEE MAGNET, 37(4), 2001, pp. 1786-1788
Roughness of thin perfluoropolyether lubricant films: Influence on disk drive technology
Authors: Mate, CM Toney, MF Leach, KA
Citation: Cm. Mate et al., Roughness of thin perfluoropolyether lubricant films: Influence on disk drive technology, IEEE MAGNET, 37(4), 2001, pp. 1821-1823
Demonstration of 35 Gbits/in(2) in media on glass substrates
Authors: Doerner, M Bian, XP Madison, M Tang, K Peng, QZ Polcyn, A Arnoldussen, T Toney, MF Mirzamaani, M Takano, K Fullerton, E Margulies, D Schabes, M Rubin, K Pinarbasi, M Yuan, S Parker, M Weller, D
Citation: M. Doerner et al., Demonstration of 35 Gbits/in(2) in media on glass substrates, IEEE MAGNET, 37(2), 2001, pp. 1052-1058
Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins
Authors: Nolting, F Scholl, A Stohr, J Seo, JW Fompeyrine, J Siegwart, H Locquet, JP Anders, S Luning, J Fullerton, EE Toney, MF Scheinfein, MR Padmore, HA
Citation: F. Nolting et al., Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins, NATURE, 405(6788), 2000, pp. 767-769
Thickness measurements of thin perfluoropolyether polymer films on siliconand amorphous-hydrogenated carbon with X-ray reflectivity, ESCA and optical ellipsometry
Authors: Toney, MF Mate, CM Leach, KA Pocker, D
Citation: Mf. Toney et al., Thickness measurements of thin perfluoropolyether polymer films on siliconand amorphous-hydrogenated carbon with X-ray reflectivity, ESCA and optical ellipsometry, J COLL I SC, 225(1), 2000, pp. 219-226
Temperature dependent chemical ordering in FePt(001) and FePt(110) films
Authors: Schwickert, MM Hannibal, KA Toney, MF Best, M Folks, L Thiele, JU Kellock, AJ Weller, D
Citation: Mm. Schwickert et al., Temperature dependent chemical ordering in FePt(001) and FePt(110) films, J APPL PHYS, 87(9), 2000, pp. 6956-6958
High magnetoresistance permalloy films deposited on a thin NiFeCr or NiCr underlayer
Authors: Lee, WY Toney, MF Tameerug, P Allen, E Mauri, D
Citation: Wy. Lee et al., High magnetoresistance permalloy films deposited on a thin NiFeCr or NiCr underlayer, J APPL PHYS, 87(9), 2000, pp. 6992-6994
Ion induced magnetization reorientation in Co/Pt multilayers for patternedmedia
Authors: Weller, D Baglin, JEE Kellock, AJ Hannibal, KA Toney, MF Kusinski, G Lang, S Folks, L Best, ME Terris, BD
Citation: D. Weller et al., Ion induced magnetization reorientation in Co/Pt multilayers for patternedmedia, J APPL PHYS, 87(9), 2000, pp. 5768-5770
High magnetoresistance in sputtered permalloy thin films through growth onseed layers of (Ni0.81Fe0.19)(1-x)Cr-x
Authors: Lee, WY Toney, MF Mauri, D
Citation: Wy. Lee et al., High magnetoresistance in sputtered permalloy thin films through growth onseed layers of (Ni0.81Fe0.19)(1-x)Cr-x, IEEE MAGNET, 36(1), 2000, pp. 381-385
High K-u materials approach to 100 Gbits/in(2)
Authors: Weller, D Moser, A Folks, L Best, ME Lee, W Toney, MF Schwickert, M Thiele, JU Doerner, MF
Citation: D. Weller et al., High K-u materials approach to 100 Gbits/in(2), IEEE MAGNET, 36(1), 2000, pp. 10-15
Microstructure and thermal stability of advanced longitudinal media
Authors: Doerner, MF Tang, K Arnoldussen, T Zeng, H Toney, MF Weller, D
Citation: Mf. Doerner et al., Microstructure and thermal stability of advanced longitudinal media, IEEE MAGNET, 36(1), 2000, pp. 43-47
New methodologies for measuring film thickness, coverage, and topography
Authors: Mate, CM Yen, BK Miller, DC Toney, MF Scarpulla, M Frommer, JE
Citation: Cm. Mate et al., New methodologies for measuring film thickness, coverage, and topography, IEEE MAGNET, 36(1), 2000, pp. 110-114
The structure of the passive film that forms on iron in aqueous environments
Authors: Davenport, AJ Oblonsky, LJ Ryan, MP Toney, MF
Citation: Aj. Davenport et al., The structure of the passive film that forms on iron in aqueous environments, J ELCHEM SO, 147(6), 2000, pp. 2162-2173
Roughness of molecularly thin perfluoropolyether polymer films
Authors: Toney, MF Mate, CM Leach, KA
Citation: Mf. Toney et al., Roughness of molecularly thin perfluoropolyether polymer films, APPL PHYS L, 77(20), 2000, pp. 3296-3298
Magnetoresistance of self-assembled lateral multilayers
Authors: Tober, ED Marks, RF Chambliss, DD Roche, KP Toney, MF Kellock, AJ Farrow, RFC
Citation: Ed. Tober et al., Magnetoresistance of self-assembled lateral multilayers, APPL PHYS L, 77(17), 2000, pp. 2728-2730
Low-dielectric, nanoporous organosilicate films prepared via inorganic/organic polymer hybrid templates
Authors: Nguyen, CV Carter, KR Hawker, CJ Hedrick, JL Jaffe, RL Miller, RD Remenar, JF Rhee, HW Rice, PM Toney, MF Trollsas, M Yoon, DY
Citation: Cv. Nguyen et al., Low-dielectric, nanoporous organosilicate films prepared via inorganic/organic polymer hybrid templates, CHEM MATER, 11(11), 1999, pp. 3080-3085
In situ x-ray-diffraction studies of passive oxide films
Authors: Ryan, MP Toney, MF Davenport, AJ Oblonsky, LJ
Citation: Mp. Ryan et al., In situ x-ray-diffraction studies of passive oxide films, MRS BULL, 24(7), 1999, pp. 29-35
Effects of stacking faults on magnetic viscosity in thin film magnetic recording media
Authors: Dova, P Laidler, H O'Grady, K Toney, MF Doerner, MF
Citation: P. Dova et al., Effects of stacking faults on magnetic viscosity in thin film magnetic recording media, J APPL PHYS, 85(5), 1999, pp. 2775-2781
Metal oxide surfaces and their interactions with aqueous solutions and microbial organisms
Authors: Brown, GE Henrich, VE Casey, WH Clark, DL Eggleston, C Felmy, A Goodman, DW Gratzel, M Maciel, G McCarthy, MI Nealson, KH Sverjensky, DA Toney, MF Zachara, JM
Citation: Ge. Brown et al., Metal oxide surfaces and their interactions with aqueous solutions and microbial organisms, CHEM REV, 99(1), 1999, pp. 77-174
Risultati: 1-21 |