Authors: Mock, P Booker, GR Mason, NJ Nicholas, RJ Aphandery, E Topuria, T Browning, ND

Citation: P. Mock et al., MOVPE grown self-assembled and self-ordered InSb quantum dots in a GaSb matrix assessed by AFM, CTEM, HRTEM and PL, MAT SCI E B, 80(1-3), 2001, pp. 112-115

Authors: Browning, ND Arslan, I Moeck, P Topuria, T

Citation: Nd. Browning et al., Atomic resolution scanning transmission electron microscopy, PHYS ST S-B, 227(1), 2001, pp. 229-245

Authors: Mock, P Topuria, T Browning, ND Titova, L Dobrowolska, M Lee, S Furdyna, JK

Citation: P. Mock et al., Self-ordered CdSe quantum dots in ZnSe and (Zn,Mn)Se matrices assessed by transmission electron microscopy and photoluminescence spectroscopy, J ELEC MAT, 30(6), 2001, pp. 748-755

Authors: Browning, ND Arslan, I Ito, Y James, EM Klie, RF Moeck, P Topuria, T Xin, Y

Citation: Nd. Browning et al., Application of atomic scale STEM techniques to the study of interfaces anddefects in materials, J ELEC MICR, 50(3), 2001, pp. 205-218

Authors: Mock, P Topuria, T Browning, ND Booker, GR Mason, NJ Nicholas, RJ Dobrowolska, M Lee, S Furdyna, JK

Citation: P. Mock et al., Internal self-ordering in In(Sb,As), (In,Ga)Sb, and (Cd,Zn,Mn)Se nano-agglomerates/quantum dots, APPL PHYS L, 79(7), 2001, pp. 946-948

Authors: Topuria, T James, EM Browning, ND Ma, Z

Citation: T. Topuria et al., Direct atomic scale characterization of interfaces and doping layers in field-effect transistors, APPL PHYS L, 79(1), 2001, pp. 132-134