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Results: 1-13 |
Results: 13
Properties of YBCO films at high current densities: Fault current limiter implications
Authors: Decroux, M Antognazza, L Musolino, N de Chambrier, E Reymond, S Triscone, JM Fischer, O Paul, W Chen, M
Citation: M. Decroux et al., Properties of YBCO films at high current densities: Fault current limiter implications, IEEE APPL S, 11(1), 2001, pp. 2046-2049
Hall effect in underdoped GdBa2CU3O7-delta thin films: Evidence for a crossover line in the pseudogap regime - art. no. 024513
Authors: Matthey, D Gariglio, S Giovannini, B Triscone, JM
Citation: D. Matthey et al., Hall effect in underdoped GdBa2CU3O7-delta thin films: Evidence for a crossover line in the pseudogap regime - art. no. 024513, PHYS REV B, 6402(2), 2001, pp. 4513
Transport properties in doped Mott insulator epitaxial La1-xTiO3+delta thin films - art. no. 161103
Authors: Gariglio, S Seo, JW Fompeyrine, J Locquet, JP Triscone, JM
Citation: S. Gariglio et al., Transport properties in doped Mott insulator epitaxial La1-xTiO3+delta thin films - art. no. 161103, PHYS REV B, 6316(16), 2001, pp. 1103
Nanoscale control of ferroelectric polarization and domain size in epitaxial Pb(Zr0.2Ti0.8)O-3 thin films
Authors: Paruch, P Tybell, T Triscone, JM
Citation: P. Paruch et al., Nanoscale control of ferroelectric polarization and domain size in epitaxial Pb(Zr0.2Ti0.8)O-3 thin films, APPL PHYS L, 79(4), 2001, pp. 530-532
Special issue: Fifth International Workshop on Oxide Electronics
Authors: Kawasaki, M Eom, CB Hosono, H Ramesh, R Triscone, JM Venkatesan, T Xiang, XD
Citation: M. Kawasaki et al., Special issue: Fifth International Workshop on Oxide Electronics, J ELECTROCE, 4(2-3), 2000, pp. 263-263
Study of the current-induced transition into a highly dissipative state: implications for the fault current limiter
Authors: Decroux, M Antognazza, L Musolino, N Triscone, JM Reinert, P Koller, E Reymond, S Fischer, O
Citation: M. Decroux et al., Study of the current-induced transition into a highly dissipative state: implications for the fault current limiter, PHYSICA B, 284, 2000, pp. 2089-2090
Piezoelectric response of epitaxial Pb(Zr0.2Ti0.8)O-3 films measured by scanning tunneling microscopy
Authors: Kuffer, O Maggio-Aprile, I Triscone, JM Fischer, O Renner, C
Citation: O. Kuffer et al., Piezoelectric response of epitaxial Pb(Zr0.2Ti0.8)O-3 films measured by scanning tunneling microscopy, APPL PHYS L, 77(11), 2000, pp. 1701-1703
Electrostatic modulation of superconductivity in ultrathin GdBa2Cu3O7-x films
Authors: Ahn, CH Gariglio, S Paruch, P Tybell, T Antognazza, L Triscone, JM
Citation: Ch. Ahn et al., Electrostatic modulation of superconductivity in ultrathin GdBa2Cu3O7-x films, SCIENCE, 284(5417), 1999, pp. 1152-1155
Transport properties and fluctuations in underdoped GdBa2Cu3Ox thin films
Authors: Matthey, D Marre, D Gariglio, S Triscone, JM
Citation: D. Matthey et al., Transport properties and fluctuations in underdoped GdBa2Cu3Ox thin films, J L TEMP PH, 117(5-6), 1999, pp. 1169-1173
Highly dissipative state of YBa2Cu3O7 thin films at very large current densities
Authors: Antognazza, L Decroux, M Musolino, N Triscone, JM Reinert, P Koller, E Reymond, S Chen, M Paul, W Fischer, O
Citation: L. Antognazza et al., Highly dissipative state of YBa2Cu3O7 thin films at very large current densities, J L TEMP PH, 117(5-6), 1999, pp. 1543-1547
Ferroelectricity in thin perovskite films
Authors: Tybell, T Ahn, CH Triscone, JM
Citation: T. Tybell et al., Ferroelectricity in thin perovskite films, APPL PHYS L, 75(6), 1999, pp. 856-858
Local analysis and modification of ferroelectric domain structures in thinfilms of Pb(ZrxTi1-x)O-3
Authors: Tybell, T Ahn, CH Antognazza, L Triscone, JM
Citation: T. Tybell et al., Local analysis and modification of ferroelectric domain structures in thinfilms of Pb(ZrxTi1-x)O-3, VIDE, 53(289), 1998, pp. 551
Scanning probe microscopy for the imaging and control of ferroelectric oxides
Authors: Ahn, CH Tybell, T Kuffer, O Antognazza, L Char, K Hammond, RH Beasley, MR Fischer, O Triscone, JM
Citation: Ch. Ahn et al., Scanning probe microscopy for the imaging and control of ferroelectric oxides, MAT SCI E B, 56(2-3), 1998, pp. 173-177
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