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Results:
1-16
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Results: 16
Authors:
Larsen, BH
Larsen, JG
Abrahamsen, AB
Poulsen, HF
Tschentscher, T
Christiansen, JKS
Andersen, NH
Citation: Bh. Larsen et al., Relation between texture and critical current density of textured YBa2Cu3Ox plates, IEEE APPL S, 11(1), 2001, pp. 3513-3516
Authors:
Kernavanois, N
de Reotier, PD
Yaouanc, A
Sanchez, JP
Honkimaki, V
Tschentscher, T
McCarthy, J
Vogt, O
Citation: N. Kernavanois et al., Orbital and spin magnetism in US - comparison with USe and UTe, J PHYS-COND, 13(43), 2001, pp. 9677-9690
Authors:
Wcislak, L
Schneider, JR
Tschentscher, T
Klein, H
Bunge, HJ
Citation: L. Wcislak et al., Hard X-ray texture measurements with an on-line image plate detector, NUCL INST A, 467, 2001, pp. 1257-1260
Authors:
Falkenberg, G
Clauss, O
Swiderski, A
Tschentscher, T
Citation: G. Falkenberg et al., Optics for the X-ray fluorescence beamline at HASYLAB, NUCL INST A, 467, 2001, pp. 737-740
Authors:
Sattler, T
Tschentscher, T
Schneider, JR
Vos, M
Kheifets, AS
Lun, DR
Weigold, E
Dollinger, G
Bross, H
Bell, F
Citation: T. Sattler et al., Anisotropy of the electron momentum density of graphite studied by (gamma,e gamma) and (e,2e) spectroscopy - art. no. 155204, PHYS REV B, 6315(15), 2001, pp. 5204
Authors:
Falkenberg, G
Clauss, O
Swiderski, A
Tschentscher, T
Citation: G. Falkenberg et al., Upgrade of the x-ray fluorescence beamline at HASYLAB/DESY, X-RAY SPECT, 30(3), 2001, pp. 170-173
Authors:
Suortti, P
Buslaps, T
Honkimaki, V
Metz, C
Shukla, A
Tschentscher, T
Kwiatkowska, J
Maniawski, F
Bansil, A
Kaprzyk, S
Kheifets, AS
Lun, DR
Sattler, T
Schneider, JR
Bell, F
Citation: P. Suortti et al., Fermi-surface and electron correlation in Al studied by Compton scattering, J PHYS CH S, 61(3), 2000, pp. 397-401
Authors:
Mishin, OV
Lauridsen, EM
Lassen, NCK
Bruckner, G
Tschentscher, T
Bay, B
Jensen, DJ
Poulsen, HF
Citation: Ov. Mishin et al., Application of high-energy synchrotron radiation for texture studies, J APPL CRYS, 33, 2000, pp. 364-371
Authors:
Spielberger, L
Brauning, H
Muthig, A
Tang, JZ
Wang, J
Qiu, Y
Dorner, R
Jagutzki, O
Tschentscher, T
Honkimaki, V
Mergel, V
Achler, M
Weber, T
Khayyat, K
Burgdorfer, J
McGuire, J
Schmidt-Bocking, H
Citation: L. Spielberger et al., Cross-section ratio of double to single ionization of helium by Compton scattering of 40-100-keV x rays, PHYS REV A, 59(1), 1999, pp. 371-379
Authors:
Metz, C
Tschentscher, T
Suortti, P
Kheifets, AS
Lun, DR
Sattler, T
Schneider, JR
Bell, F
Citation: C. Metz et al., Three-dimensional electron momentum densities of graphite and fullerene: acomparison, J PHYS-COND, 11(19), 1999, pp. 3933-3942
Authors:
Materna, T
Jolie, J
Mondelaers, W
Masschaele, A
Honkimaki, V
Koch, A
Tschentscher, T
Citation: T. Materna et al., Uranium-sensitive tomography with synchrotron radiation, J SYNCHROTR, 6, 1999, pp. 1059-1064
Authors:
Suortti, P
Buslaps, T
Fajardo, P
Honkimaki, V
Kretzschmer, M
Lienert, U
McCarthy, JE
Renier, M
Shukla, A
Tschentscher, T
Meinander, T
Citation: P. Suortti et al., Scanning x-ray spectrometer for high-resolution Compton profile measurements at ESRF, J SYNCHROTR, 6, 1999, pp. 69-80
Authors:
Reimers, W
Pyzalla, A
Broda, M
Brusch, G
Dantz, D
Schmackers, T
Liss, KD
Tschentscher, T
Citation: W. Reimers et al., The use of high-energy synchrotron diffraction for residual stress analyses, J MAT SCI L, 18(7), 1999, pp. 581-583
Authors:
Metz, C
Tschentscher, T
Sattler, T
Hoppner, K
Schneider, JR
Wittmaack, K
Frischke, D
Bell, F
Citation: C. Metz et al., Influence of alloying on the electron momentum density in the Cu-Ni system, PHYS REV B, 60(20), 1999, pp. 14049-14056
Authors:
Metz, C
Tschentscher, T
Suortti, P
Kheifets, AS
Lun, DR
Sattler, T
Schneider, JR
Bell, F
Citation: C. Metz et al., Three-dimensional electron momentum density of aluminum by (gamma,e gamma)spectroscopy, PHYS REV B, 59(16), 1999, pp. 10512-10520
Authors:
Reimers, W
Broda, M
Brusch, G
Dantz, D
Liss, KD
Pyzalla, A
Schmackers, T
Tschentscher, T
Citation: W. Reimers et al., Evaluation of residual stresses in the bulk of materials by high energy synchrotron diffraction, J NOND EVAL, 17(3), 1998, pp. 129-140
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