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Results: 1-12 |
Results: 12
Transition radiation from electrons: Application to thin film and superlattice analysis - art. no. 155318
Authors: Feranchuk, ID Ulyanenkov, A
Citation: Id. Feranchuk et A. Ulyanenkov, Transition radiation from electrons: Application to thin film and superlattice analysis - art. no. 155318, PHYS REV B, 6315(15), 2001, pp. 5318
Interference of parametric X-ray and coherent Bremsstrahlung radiation from nonrelativistic electrons: application to the phase analysis in crystallography
Authors: Feranchuk, ID Ulyanenkov, A
Citation: Id. Feranchuk et A. Ulyanenkov, Interference of parametric X-ray and coherent Bremsstrahlung radiation from nonrelativistic electrons: application to the phase analysis in crystallography, ACT CRYST A, 57, 2001, pp. 283-289
X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires
Authors: Ulyanenkov, A Inaba, K Mikulik, P Darowski, N Omote, K Pietsch, U Grenzer, J Forchel, A
Citation: A. Ulyanenkov et al., X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires, J PHYS D, 34(10A), 2001, pp. A179-A182
Parametric x-ray radiation and coherent bremsstrahlung from nonrelativistic electrons in crystals
Authors: Feranchuk, ID Ulyanenkov, A Harada, J Spence, JCH
Citation: Id. Feranchuk et al., Parametric x-ray radiation and coherent bremsstrahlung from nonrelativistic electrons in crystals, PHYS REV E, 62(3), 2000, pp. 4225-4234
Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
Authors: Pietsch, U Darowski, N Ulyanenkov, A Grenzer, J Wang, KH Forchel, A
Citation: U. Pietsch et al., Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data, PHYSICA B, 283(1-3), 2000, pp. 92-96
The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin films
Authors: Ulyanenkov, A Omote, K Harada, J
Citation: A. Ulyanenkov et al., The genetic algorithm: refinement of X-ray reflectivity data from multilayers and thin films, PHYSICA B, 283(1-3), 2000, pp. 237-241
X-ray scattering study of interfacial roughness correlation in Mo/Si multilayers fabricated by ion beam sputtering
Authors: Ulyanenkov, A Matsuo, R Omote, K Inaba, K Harada, J Ishino, M Nishii, M Yoda, O
Citation: A. Ulyanenkov et al., X-ray scattering study of interfacial roughness correlation in Mo/Si multilayers fabricated by ion beam sputtering, J APPL PHYS, 87(10), 2000, pp. 7255-7260
Evaluation of strain distribution in freestanding and buried lateral nanostructures
Authors: Ulyanenkov, A Darowski, N Grenzer, J Pietsch, U Wang, KH Forchel, A
Citation: A. Ulyanenkov et al., Evaluation of strain distribution in freestanding and buried lateral nanostructures, PHYS REV B, 60(24), 1999, pp. 16701-16714
About new applications of parametric X-radiation for crystallography
Authors: Feranchuk, ID Ulyanenkov, A
Citation: Id. Feranchuk et A. Ulyanenkov, About new applications of parametric X-radiation for crystallography, ACT CRYST A, 55, 1999, pp. 466-470
Specular and non-specular x-ray scattering study of SiO2/Si structures
Authors: Ulyanenkov, A Omote, K Matsuo, R Harada, J Matsuno, SY
Citation: A. Ulyanenkov et al., Specular and non-specular x-ray scattering study of SiO2/Si structures, J PHYS D, 32(12), 1999, pp. 1313-1318
X-ray reflectivity from ZnSe/GaAs heterostructures
Authors: Ulyanenkov, A Takase, A Kuribayashi, M Ishida, K Ohtake, A Arai, K Hanada, T Yasuda, T Yao, T
Citation: A. Ulyanenkov et al., X-ray reflectivity from ZnSe/GaAs heterostructures, J APPL PHYS, 85(3), 1999, pp. 1520-1523
In-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
Authors: Ulyanenkov, A Baumbach, T Darowski, N Pietsch, U Wang, KH Forchel, A Wiebach, T
Citation: A. Ulyanenkov et al., In-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001], J APPL PHYS, 85(3), 1999, pp. 1524-1530
Risultati: 1-12 |