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Results: 1-16 |
Results: 16

Authors: Kleineberg, U Haindl, G Hutten, A Reiss, G Gullikson, EM Jones, MS Mrowka, S Rekawa, SB Underwood, JH
Citation: U. Kleineberg et al., Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy, APPL PHYS A, 73(4), 2001, pp. 515-519

Authors: Yang, SH Mun, BS Kay, AW Kim, SK Kortright, JB Underwood, JH Hussain, Z Fadley, CS
Citation: Sh. Yang et al., Depth-resolved photoemission spectroscopy with soft X-ray standing waves, J ELEC SPEC, 114, 2001, pp. 1089-1095

Authors: Underwood, JH Glennon, MJ
Citation: Jh. Underwood et Mj. Glennon, Stress and fatigue life modeling of cannon breech closures including effects of material strength and residual stress, J PRES VESS, 123(1), 2001, pp. 148-152

Authors: Naulleau, PP Goldberg, KA Batson, PJ Jeong, S Underwood, JH
Citation: Pp. Naulleau et al., Tolerancing of diffraction-limited Kirkpatrick-Baez synchrotron beamline optics for extreme-ultraviolet metrology, APPL OPTICS, 40(22), 2001, pp. 3703-3709

Authors: Lawniczak-Jablonska, K Suski, T Gorczyca, I Christensen, NE Attenkofer, KE Perera, RCC Gullikson, EM Underwood, JH Ederer, DL Weber, ZL
Citation: K. Lawniczak-jablonska et al., Electronic states in valence and conduction bands of group-III nitrides: Experiment and theory, PHYS REV B, 61(24), 2000, pp. 16623-16632

Authors: Underwood, JH
Citation: Jh. Underwood, Comments on "Gas-metal reaction products in the erosion of chromium platedgun bores," by Cote and Rickard, WEAR, 241(1), 2000, pp. 118-119

Authors: Yang, SH Mun, BS Kay, AW Kim, SK Kortright, JB Underwood, JH Hussain, Z Fadley, CS
Citation: Sh. Yang et al., Depth-resolved photoemission spectroscopy from surface and buried layers with soft X-ray standing waves, SURF SCI, 461(1-3), 2000, pp. L557-L564

Authors: Muramatsu, Y Tani, Y Aoi, Y Kamijo, E Kaneyoshi, T Motoyama, M Delaunay, JJ Hayashi, T Grush, MM Callcott, TA Ederer, DL Heske, C Underwood, JH Perera, RCC
Citation: Y. Muramatsu et al., High-resolution soft X-ray emission spectra of crystalline carbon nitride films deposited by electron cyclotron resonance sputtering, JPN J A P 1, 38(9A), 1999, pp. 5143-5147

Authors: Jeong, ST Johnson, L Rekawa, S Walton, CC Prisbrey, ST Tejnil, E Underwood, JH Bokor, J
Citation: St. Jeong et al., Actinic detection of sub-100 nm defects on extreme ultraviolet lithographymask blanks, J VAC SCI B, 17(6), 1999, pp. 3009-3013

Authors: Sacchi, M Hague, CF Gota, S Guiot, E Gautier-Soyer, M Pasquali, L Mrowka, S Gullikson, EM Underwood, JH
Citation: M. Sacchi et al., Resonant scattering of polarized soft X-rays for the study of magnetic oxide layers, J ELEC SPEC, 103, 1999, pp. 407-412

Authors: Sacchi, M Mirone, A Hague, CF Mariot, JM Pasquali, L Isberg, P Gullikson, EM Underwood, JH
Citation: M. Sacchi et al., Soft-x-ray resonant scattering from V/Fe (001) magnetic superlattices, PHYS REV B, 60(18), 1999, pp. R12569-R12572

Authors: Parker, AP Underwood, JH Kendall, DP
Citation: Ap. Parker et al., Bauschinger effect design procedures for autofrettaged tubes including material removal and Sachs' method, J PRES VESS, 121(4), 1999, pp. 430-437

Authors: Underwood, JH Parker, AP Cote, PJ Sopok, S
Citation: Jh. Underwood et al., Compressive thermal yielding leading to hydrogen cracking in a fired cannon, J PRES VESS, 121(1), 1999, pp. 116-120

Authors: Attwood, DT Naulleau, P Goldberg, KA Tejnil, E Chang, C Beguiristain, R Batson, P Bokor, J Gullikson, EM Koike, M Medecki, H Underwood, JH
Citation: Dt. Attwood et al., Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions, IEEE J Q EL, 35(5), 1999, pp. 709-720

Authors: Yamazaki, T Gullikson, E Miyata, N Koike, M Harada, Y Mrowka, S Kleineberg, U Underwood, JH Yanagihara, MM Sano, K
Citation: T. Yamazaki et al., Comparison of mechanically ruled versus holographically varied line-spacing gratings for a soft-x-ray flat-field spectrograph, APPL OPTICS, 38(19), 1999, pp. 4001-4003

Authors: Jeong, ST Idir, M Lin, Y Johnson, L Rekawa, S Jones, M Denham, P Batson, P Levesque, R Kearney, P Yan, PY Gullikson, E Underwood, JH Bokor, J
Citation: St. Jeong et al., At-wavelength detection of extreme ultraviolet lithography mask blank defects, J VAC SCI B, 16(6), 1998, pp. 3430-3434
Risultati: 1-16 |