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Citation: R. Resch et al., INVESTIGATION OF ZNS THIN-FILMS ON SI(100) BY PHASE DETECTION IMAGINGAND YOUNGS MODULUS MICROSCOPY, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 613-617

Authors: VALKONEN MP LINDROOS S KANNIAINEN T LESKELA M RESCH R FRIEDBACHER G GRASSERBAUER M

Citation: Mp. Valkonen et al., ATOMIC-FORCE MICROSCOPY STUDIES OF ZNS FILMS GROWN ON (100)GAAS BY THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD, Journal of materials research, 13(6), 1998, pp. 1688-1692

Authors: VALKONEN MP LINDROOS S RESCH R LESKELA M FRIEDBACHER G GRASSERBAUER M

Citation: Mp. Valkonen et al., GROWTH OF ZINC-SULFIDE THIN-FILMS ON (100)SI WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD STUDIED BY ATOMIC-FORCE MICROSCOPY, Applied surface science, 136(1-2), 1998, pp. 131-136

Authors: VALKONEN MP LINDROOS S LESKELA M

Citation: Mp. Valkonen et al., CDXZN1-XS SOLID-SOLUTION THIN-FILMS, CDS THIN-FILMS AND CDS ZNS MULTILAYER THIN-FILMS GROWN BY SILAR TECHNIQUE/, Applied surface science, 134(1-4), 1998, pp. 283-291

Authors: VALKONEN MP LINDROOS S KANNIAINEN T LESKELA M TAPPER U KAUPPINEN E

Citation: Mp. Valkonen et al., THIN MULTILAYER CDS ZNS FILMS GROWN BY SILAR TECHNIQUE/, Applied surface science, 120(1-2), 1997, pp. 58-64

Authors: VALKONEN MP KANNIAINEN T LINDROOS S LESKELA M RAUHALA E

Citation: Mp. Valkonen et al., GROWTH OF ZNS, CDS AND MULTILAYER ZNS CDS THIN-FILMS BY SILAR TECHNIQUE/, Applied surface science, 115(4), 1997, pp. 386-392