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Results:
1-21
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Results: 21
Authors:
BLAAUW M
FERNANDEZ VO
VANESPEN P
BERNASCONI G
NOY RC
DUNG HM
MOLLA NI
Citation: M. Blaauw et al., THE 1995 IAEA INTERCOMPARISON OF GAMMA-RAY SPECTRUM ANALYSIS SOFTWARE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 387(3), 1997, pp. 416-432
Authors:
VERLINDEN G
JANSSENS G
GIJBELS R
VANESPEN P
GEUENS I
Citation: G. Verlinden et al., 3-DIMENSIONAL CHEMICAL CHARACTERIZATION OF COMPLEX SILVER-HALIDE MICROCRYSTALS BY SCANNING ION MICROPROBE MASS ANALYSIS, Analytical chemistry, 69(18), 1997, pp. 3772-3779
Authors:
POELS K
VANVAECK L
STRUYF H
VANESPEN P
ADAMS F
TERRYN H
DEBRUYNE P
Citation: K. Poels et al., FEASIBILITY OF FOURIER-TRANSFORM LASER MICROPROBE MASS-SPECTROMETRY FOR THE ANALYSIS OF LUBRICATING EMULSIONS ON ROLLED ALUMINUM, Rapid communications in mass spectrometry, 10(11), 1996, pp. 1351-1360
Authors:
BONDARENKO I
TREIGER B
VANGRIEKEN R
VANESPEN P
Citation: I. Bondarenko et al., IDAS - A WINDOWS-BASED SOFTWARE PACKAGE FOR CLUSTER-ANALYSIS, Spectrochimica acta, Part B: Atomic spectroscopy, 51(4), 1996, pp. 441-456
Authors:
JANSSENS K
VEKEMANS B
ADAMS F
VANESPEN P
MUTSAERS P
Citation: K. Janssens et al., ACCURATE EVALUATION OF MU-PIXE AND MU-XRF SPECTRAL DATA THROUGH ITERATIVE LEAST-SQUARES FITTING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 179-185
Authors:
VEKEMANS B
JANSSENS K
VINCZE L
ADAMS F
VANESPEN P
Citation: B. Vekemans et al., COMPARISON OF SEVERAL BACKGROUND COMPENSATION METHODS USEFUL FOR EVALUATION OF ENERGY-DISPERSIVE X-RAY-FLUORESCENCE SPECTRA, Spectrochimica acta, Part B: Atomic spectroscopy, 50(2), 1995, pp. 149-169
Authors:
SCHRAM T
GOEMINNE G
TERRYN H
VANHOOLST W
VANESPEN P
Citation: T. Schram et al., STUDY OF THE COMPOSITION OF ZIRCONIUM-BASED CHROMIUM FREE CONVERSION LAYERS ON ALUMINUM, Transactions of the Institute of Metal Finishing, 73, 1995, pp. 91-95
Authors:
TREIGER B
INJUK J
BONDARENKO I
VANESPEN P
VANGRIEKEN R
BREITENBACH L
WATJEN U
Citation: B. Treiger et al., NONLINEAR MAPPING OF MICROBEAM PROTON-INDUCED X-RAY-EMISSION DATA FORSOURCE IDENTIFICATION OF NORTH-SEA AEROSOLS, Spectrochimica acta, Part B: Atomic spectroscopy, 49(4), 1994, pp. 345-353
Authors:
VANESPEN P
Citation: P. Vanespen, TRENDS IN IMAGING ANALYTICAL TECHNIQUES AT PITTCON-94, Analusis, 22(4), 1994, pp. 130000031-130000031
Authors:
LI YW
VANESPEN P
Citation: Yw. Li et P. Vanespen, STUDY OF THE INFLUENCE OF NEURAL-NETWORK PARAMETERS ON THE PERFORMANCE-CHARACTERISTICS IN PATTERN-RECOGNITION, Chemometrics and intelligent laboratory systems, 25(2), 1994, pp. 241-248
Authors:
BONDARENKO I
VANMALDEREN H
TREIGER B
VANESPEN P
VANGRIEKEN R
Citation: I. Bondarenko et al., HIERARCHICAL CLUSTER-ANALYSIS WITH STOPPING RULES BUILT ON AKAIKES INFORMATION CRITERION FOR AEROSOL-PARTICLE CLASSIFICATION BASED ON ELECTRON-PROBE X-RAY-MICROANALYSIS, Chemometrics and intelligent laboratory systems, 22(1), 1994, pp. 87-95
Authors:
SWERTS J
AERTS A
DEBISCOP N
ADAMS F
VANESPEN P
Citation: J. Swerts et al., AGE-DETERMINATION OF CHINESE PORCELAIN BY X-RAY-FLUORESCENCE AND MULTIVARIATE-ANALYSIS, Chemometrics and intelligent laboratory systems, 22(1), 1994, pp. 97-105
Authors:
VEKEMANS B
JANSSENS K
VINCZE L
ADAMS F
VANESPEN P
Citation: B. Vekemans et al., ANALYSIS OF X-RAY-SPECTRA BY ITERATIVE LEAST-SQUARES (AXIL) - NEW DEVELOPMENTS, X-ray spectrometry, 23(6), 1994, pp. 278-285
Authors:
WANG H
VANESPEN P
Citation: H. Wang et P. Vanespen, RESOLUTION ENHANCEMENT OF SECONDARY-ION MICROPROBE IMAGES USING FOURIER DECONVOLUTION, Vacuum, 45(4), 1994, pp. 447-450
Authors:
VANESPEN P
Citation: P. Vanespen, QUANTITATIVE MICROBEAM ANALYSIS OF PARTICLES, Mikrochimica acta, 114, 1994, pp. 129-142
Authors:
TREIGER B
BONDARENKO I
VANESPEN P
VANGRIEKEN R
ADAMS F
Citation: B. Treiger et al., CLASSIFICATION OF MINERAL PARTICLES BY NONLINEAR MAPPING OF ELECTRON-MICROPROBE ENERGY-DISPERSIVE X-RAY-SPECTRA, Analyst, 119(5), 1994, pp. 971-974
Authors:
VANESPEN P
Citation: P. Vanespen, TRENDS IN IMAGING ANALYTICAL TECHNIQUES, SURFACE AND MICROANALYSIS ATPITTCON 93, Analusis, 21(4), 1993, pp. 19-20
Authors:
TRINCAVELLI J
MONTORO S
VANESPEN P
VANGRIEKEN R
Citation: J. Trincavelli et al., M-ALPHA L-ALPHA INTENSITY RATIOS FOR TA, W, PT, AU, PB AND BI FOR ELECTRON ENERGIES IN THE 11-40 KEV RANGE/, X-ray spectrometry, 22(5), 1993, pp. 372-376
Authors:
JANSSENS K
VINCZE L
VANESPEN P
ADAMS F
Citation: K. Janssens et al., MONTE-CARLO SIMULATION OF CONVENTIONAL AND SYNCHROTRON ENERGY-DISPERSIVE X-RAY SPECTROMETERS, X-ray spectrometry, 22(4), 1993, pp. 234-243
Authors:
SWERTS J
VANESPEN P
GELADI P
Citation: J. Swerts et al., PARTIAL LEAST-SQUARES TECHNIQUES IN THE ENERGY-DISPERSIVE X-RAY-FLUORESCENCE DETERMINATION OF SULFUR GRAPHITE MIXTURES, Analytical chemistry, 65(9), 1993, pp. 1181-1185
Authors:
TREIGER B
VANMALDEREN H
BONDARENKO I
VANESPEN P
VANGRIEKEN R
Citation: B. Treiger et al., STUDYING AEROSOL SAMPLES BY NONLINEAR MAPPING OF ELECTRON-PROBE MICROANALYSIS DATA, Analytica chimica acta, 284(1), 1993, pp. 119-124
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