ACNP - Italian Periodicals Catalogue

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Results: 1-9 |

Results: 9

GMR IN DC MAGNETRON-SPUTTERED NI81FE19 CU MULTILAYERS/

Authors: MAO M CERJAN C GIBBONS M LAW B GRABNER F VERNON SP WALL M

Citation: M. Mao et al., GMR IN DC MAGNETRON-SPUTTERED NI81FE19 CU MULTILAYERS/, IEEE transactions on magnetics, 34(4), 1998, pp. 915-917

MASK BLANKS FOR EXTREME-ULTRAVIOLET LITHOGRAPHY - ION-BEAM SPUTTER-DEPOSITION OF LOW DEFECT DENSITY MO SI MULTILAYERS/

Authors: KEARNEY PA MOORE CE TAN SI VERNON SP LEVESQUE RA

Citation: Pa. Kearney et al., MASK BLANKS FOR EXTREME-ULTRAVIOLET LITHOGRAPHY - ION-BEAM SPUTTER-DEPOSITION OF LOW DEFECT DENSITY MO SI MULTILAYERS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2452-2454

GMR OF CO CU MULTILAYERS WITH REDUCED HYSTERESIS AND LOW-FIELD RESPONSE/

Authors: MAO M GIBBONS M LAW B GRABNER F VERNON SP CERJAN C

Citation: M. Mao et al., GMR OF CO CU MULTILAYERS WITH REDUCED HYSTERESIS AND LOW-FIELD RESPONSE/, IEEE transactions on magnetics, 33(5), 1997, pp. 3532-3534

PRECISION OPTICAL ASPHERES FOR EXTREME-ULTRAVIOLET LITHOGRAPHY

Authors: KANIA DR GAINES DP SWEENEY DS SOMMARGREN GE LAFONTAINE B VERNON SP TICHENOR DA BJORKHOLM JE ZERNIKE F KESTNER RN

Citation: Dr. Kania et al., PRECISION OPTICAL ASPHERES FOR EXTREME-ULTRAVIOLET LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3706-3708

MAGNETIC FORCE MICROSCOPY OF SINGLE-DOMAIN COBALT DOTS PATTERNED USING INTERFERENCE LITHOGRAPHY

Authors: FERNANDEZ A BEDROSSIAN PJ BAKER SL VERNON SP KANIA DR

Citation: A. Fernandez et al., MAGNETIC FORCE MICROSCOPY OF SINGLE-DOMAIN COBALT DOTS PATTERNED USING INTERFERENCE LITHOGRAPHY, IEEE transactions on magnetics, 32(5), 1996, pp. 4472-4474

CHIRPED MULTILAYER COATINGS FOR INCREASED X-RAY THROUGHPUT

Authors: VERNON SP STEARNS DG ROSEN RS

Citation: Sp. Vernon et al., CHIRPED MULTILAYER COATINGS FOR INCREASED X-RAY THROUGHPUT, Optics letters, 18(9), 1993, pp. 672-674

MULTILAYER MIRROR TECHNOLOGY FOR SOFT-X-RAY PROJECTION LITHOGRAPHY

Authors: STEARNS DG ROSEN RS VERNON SP

Citation: Dg. Stearns et al., MULTILAYER MIRROR TECHNOLOGY FOR SOFT-X-RAY PROJECTION LITHOGRAPHY, Applied optics, 32(34), 1993, pp. 6952-6960

ION-ASSISTED SPUTTER-DEPOSITION OF MOLYBDENUM SILICON MULTILAYERS

Authors: VERNON SP STEARNS DG ROSEN RS

Citation: Sp. Vernon et al., ION-ASSISTED SPUTTER-DEPOSITION OF MOLYBDENUM SILICON MULTILAYERS, Applied optics, 32(34), 1993, pp. 6969-6974

SILICIDE LAYER GROWTH-RATES IN MO SI MULTILAYERS/

Authors: ROSEN RS STEARNS DG VILIARDOS MA KASSNER ME VERNON SP CHENG YD

Citation: Rs. Rosen et al., SILICIDE LAYER GROWTH-RATES IN MO SI MULTILAYERS/, Applied optics, 32(34), 1993, pp. 6975-6980

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