Authors:
LESCH N
KARDUCK P
CREMER R
VONRICHTHOFEN A
Citation: N. Lesch et al., INVESTIGATION OF THE ELECTRON-BEAM-INDUCED TRANSFORMATION OF CU-3 N-FILMS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 604-607
Authors:
WITTHAUT M
CREMER R
VONRICHTHOFEN A
NEUSCHUTZ D
Citation: M. Witthaut et al., IMPROVEMENT OF THE OXIDATION BEHAVIOR OF TI1-XALXN HARD COATINGS BY OPTIMIZATION OF THE TI AL RATIO/, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 639-641
Authors:
CREMER R
WITTHAUT M
VONRICHTHOFEN A
NEUSCHUTZ D
Citation: R. Cremer et al., DETERMINATION OF THE CUBIC TO HEXAGONAL STRUCTURE TRANSITION IN THE METASTABLE SYSTEM TIN-ALN, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 642-645
Authors:
VONRICHTHOFEN A
DOMNICK R
CREMER R
NEUSCHUTZ D
Citation: A. Vonrichthofen et al., PREPARATION OF A NEW TETRAGONAL COPPER OXYNITRIDE PHASE BY REACTIVE MAGNETRON SPUTTERING, Thin solid films, 317(1-2), 1998, pp. 282-284
Authors:
VONRICHTHOFEN A
CREMER R
DOMNICK R
NEUSCHUTZ D
Citation: A. Vonrichthofen et al., USE OF AUGER AND PHOTOELECTRON LINES IN THE IDENTIFICATION OF CHEMICAL-STATES OF NOVEL TERNARY TI-AL-O FILMS PREPARED BY REACTIVE MAGNETRONSPUTTERING ION PLATING, Thin solid films, 315(1-2), 1998, pp. 66-71
Authors:
VONRICHTHOFEN A
CREMER R
WITTHAUT M
DOMNICK R
NEUSCHUTZ D
Citation: A. Vonrichthofen et al., COMPOSITION, BINDING STATES, STRUCTURE, AND MORPHOLOGY OF THE CORROSION LAYER OF AN OXIDIZED TI0.46AL0.54N FILM, Thin solid films, 312(1-2), 1998, pp. 190-194
Citation: A. Vonrichthofen et al., PREPARATION OF POLYCRYSTALLINE TI-AL-O FILMS BY MAGNETRON SPUTTERING ION PLATING - CONSTITUTION, STRUCTURE AND MORPHOLOGY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 308-311
Citation: A. Vonrichthofen et al., PREPARATION OF CUPRITE (CU2O), PARAMELACONITE (CU3(2- CHARACTERIZATION BY EPMA, XRD, HEED AND SEM()CU2(1+)O4) AND TENORITE (CUO) WITH MAGNETRON SPUTTERING ION PLATING ), Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 312-315
Citation: A. Vonrichthofen et al., MORPHOLOGY, STRUCTURE AND CONSTITUTION OF METASTABLE SINGLE-PHASE TI1-XALXN FILMS GROWN BY REACTIVE MSIP, Mikrochimica acta, 125(1-4), 1997, pp. 143-148
Citation: A. Vonrichthofen et al., CU-N FILMS GROWN BY REACTIVE MSIP - CONSTITUTION, STRUCTURE AND MORPHOLOGY, Mikrochimica acta, 125(1-4), 1997, pp. 173-177
Citation: A. Vonrichthofen, DESIGN AND CHARACTERIZATION OF A METAL-ION BEAM AND NITROGEN-RADICAL BEAM SOURCE PVD SYSTEM WITH IN-SITU AES CONSTITUTION AND HEED STRUCTURE-ANALYSIS APPLICATION TO THE GROWTH OF CU-N FILMS, Fresenius' journal of analytical chemistry, 355(5-6), 1996, pp. 543-548
Citation: A. Vonrichthofen et R. Domnick, METASTABLE SINGLE-PHASE POLYCRYSTALLINE ALUMINUM OXYNITRIDE FILMS GROWN BY MSIP - CONSTITUTION AND STRUCTURE, Thin solid films, 283(1-2), 1996, pp. 37-44
Citation: P. Karduck et A. Vonrichthofen, EPMA SPUTTER DEPTH PROFILING - A NEW TECHNIQUE FOR QUANTITATIVE IN-DEPTH ANALYSIS OF LAYERED STRUCTURES, Microscopy microanalysis microstructures, 6(4), 1995, pp. 421-432
Citation: A. Vonrichthofen et D. Neuschutz, IN-SITU HEED STRUCTURE-ANALYSIS OF ALN(X) FILMS GROWN BY THE SIMULTANEOUS USE OF A RADICAL BEAM SOURCE AND ICB TECHNIQUE, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 136-139
Citation: A. Vonrichthofen et al., KINETICS OF NITRIC-OXIDE REDUCTION WITH PURE AND POTASSIUM-DOPED CARBON, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 261-264