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Results: 1-18 |
Results: 18

Authors: LESCH N KARDUCK P CREMER R VONRICHTHOFEN A
Citation: N. Lesch et al., INVESTIGATION OF THE ELECTRON-BEAM-INDUCED TRANSFORMATION OF CU-3 N-FILMS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 604-607

Authors: WITTHAUT M CREMER R VONRICHTHOFEN A NEUSCHUTZ D
Citation: M. Witthaut et al., IMPROVEMENT OF THE OXIDATION BEHAVIOR OF TI1-XALXN HARD COATINGS BY OPTIMIZATION OF THE TI AL RATIO/, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 639-641

Authors: CREMER R WITTHAUT M VONRICHTHOFEN A NEUSCHUTZ D
Citation: R. Cremer et al., DETERMINATION OF THE CUBIC TO HEXAGONAL STRUCTURE TRANSITION IN THE METASTABLE SYSTEM TIN-ALN, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 642-645

Authors: WITTHAUT M WEISS R ZIMMERMANN E VONRICHTHOFEN A NEUSCHUTZ D
Citation: M. Witthaut et al., THE FORMATION OF INTERFACE PHASES IN THE DIFFUSION COUPLE TI-SIC, Zeitschrift fur Metallkunde, 89(9), 1998, pp. 623-628

Authors: VONRICHTHOFEN A DOMNICK R CREMER R NEUSCHUTZ D
Citation: A. Vonrichthofen et al., PREPARATION OF A NEW TETRAGONAL COPPER OXYNITRIDE PHASE BY REACTIVE MAGNETRON SPUTTERING, Thin solid films, 317(1-2), 1998, pp. 282-284

Authors: VONRICHTHOFEN A CREMER R DOMNICK R NEUSCHUTZ D
Citation: A. Vonrichthofen et al., USE OF AUGER AND PHOTOELECTRON LINES IN THE IDENTIFICATION OF CHEMICAL-STATES OF NOVEL TERNARY TI-AL-O FILMS PREPARED BY REACTIVE MAGNETRONSPUTTERING ION PLATING, Thin solid films, 315(1-2), 1998, pp. 66-71

Authors: VONRICHTHOFEN A CREMER R WITTHAUT M DOMNICK R NEUSCHUTZ D
Citation: A. Vonrichthofen et al., COMPOSITION, BINDING STATES, STRUCTURE, AND MORPHOLOGY OF THE CORROSION LAYER OF AN OXIDIZED TI0.46AL0.54N FILM, Thin solid films, 312(1-2), 1998, pp. 190-194

Authors: VONRICHTHOFEN A CREMER R DOMNICK R
Citation: A. Vonrichthofen et al., PREPARATION OF POLYCRYSTALLINE TI-AL-O FILMS BY MAGNETRON SPUTTERING ION PLATING - CONSTITUTION, STRUCTURE AND MORPHOLOGY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 308-311

Authors: VONRICHTHOFEN A DOMNICK R CREMER R
Citation: A. Vonrichthofen et al., PREPARATION OF CUPRITE (CU2O), PARAMELACONITE (CU3(2- CHARACTERIZATION BY EPMA, XRD, HEED AND SEM()CU2(1+)O4) AND TENORITE (CUO) WITH MAGNETRON SPUTTERING ION PLATING ), Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 312-315

Authors: VONRICHTHOFEN A CREMER R NEUSCHUTZ D
Citation: A. Vonrichthofen et al., MORPHOLOGY, STRUCTURE AND CONSTITUTION OF METASTABLE SINGLE-PHASE TI1-XALXN FILMS GROWN BY REACTIVE MSIP, Mikrochimica acta, 125(1-4), 1997, pp. 143-148

Authors: VONRICHTHOFEN A DOMNICK R CREMER R
Citation: A. Vonrichthofen et al., CU-N FILMS GROWN BY REACTIVE MSIP - CONSTITUTION, STRUCTURE AND MORPHOLOGY, Mikrochimica acta, 125(1-4), 1997, pp. 173-177

Authors: VONRICHTHOFEN A
Citation: A. Vonrichthofen, DESIGN AND CHARACTERIZATION OF A METAL-ION BEAM AND NITROGEN-RADICAL BEAM SOURCE PVD SYSTEM WITH IN-SITU AES CONSTITUTION AND HEED STRUCTURE-ANALYSIS APPLICATION TO THE GROWTH OF CU-N FILMS, Fresenius' journal of analytical chemistry, 355(5-6), 1996, pp. 543-548

Authors: VONRICHTHOFEN A DOMNICK R
Citation: A. Vonrichthofen et R. Domnick, METASTABLE SINGLE-PHASE POLYCRYSTALLINE ALUMINUM OXYNITRIDE FILMS GROWN BY MSIP - CONSTITUTION AND STRUCTURE, Thin solid films, 283(1-2), 1996, pp. 37-44

Authors: KARDUCK P VONRICHTHOFEN A
Citation: P. Karduck et A. Vonrichthofen, EPMA SPUTTER DEPTH PROFILING - A NEW TECHNIQUE FOR QUANTITATIVE IN-DEPTH ANALYSIS OF LAYERED STRUCTURES, Microscopy microanalysis microstructures, 6(4), 1995, pp. 421-432

Authors: KNACKE O VONRICHTHOFEN A
Citation: O. Knacke et A. Vonrichthofen, OLIGOMERIZATION OF PBO-VAPOR, Zeitschrift für physikalische Chemie, 187, 1994, pp. 257-264

Authors: VONRICHTHOFEN A NEUSCHUTZ D
Citation: A. Vonrichthofen et D. Neuschutz, IN-SITU HEED STRUCTURE-ANALYSIS OF ALN(X) FILMS GROWN BY THE SIMULTANEOUS USE OF A RADICAL BEAM SOURCE AND ICB TECHNIQUE, Fresenius' journal of analytical chemistry, 349(1-3), 1994, pp. 136-139

Authors: VONRICHTHOFEN A MATSUO M KARDUCK P AMMANN N
Citation: A. Vonrichthofen et al., COMBINED EPMA AND AES DEPTH PROFILING OF A MULTILAYER TI-AL-O-N COATING, Mikrochimica acta, 114, 1994, pp. 511-523

Authors: VONRICHTHOFEN A WENDEL E NEUSCHUTZ D
Citation: A. Vonrichthofen et al., KINETICS OF NITRIC-OXIDE REDUCTION WITH PURE AND POTASSIUM-DOPED CARBON, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 261-264
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