Authors: Vasilenko, AP Kolesnikov, AV Nikitenko, SG Fedorov, AA Sokolov, LV Nikiforov, AI Trukhanov, EM

Citation: Ap. Vasilenko et al., X-ray film interferometer as an instrument for semiconductor heterostructure investigation, NUCL INST A, 470(1-2), 2001, pp. 110-113

Authors: Kolesnikov, AV Vasilenko, AP Trukhanov, EM Gutakovsky, AK

Citation: Av. Kolesnikov et al., Stress relaxation by generation of L-shape misfit dislocations in (001) heterostructures with diamond and sphalerite lattices, APPL SURF S, 166(1-4), 2000, pp. 57-60

Authors: Kolesnikov, AV Vasilenko, AP Trukhanov, EM Sokolov, LV Fedorov, AA Pchelyakov, OP Romanov, SI

Citation: Av. Kolesnikov et al., Investigation of the atomic crystal plane relief by X-ray epitaxial film interferometer, APPL SURF S, 166(1-4), 2000, pp. 82-86

Authors: Trukhanov, EM Revenko, MA Amirzhanov, RM Fedorov, AA Kolesnikov, AV Nikitenko, SG Vasilenko, AP

Citation: Em. Trukhanov et al., Diffraction method for structure investigations of semiconductor heterosystems using synchrotron variable wavelength, NUCL INST A, 448(1-2), 2000, pp. 282-285

Authors: Fedorov, AA Kolesnikov, AV Vasilenko, AP Pchelyakov, OP Romanov, SI Sokolov, LV Trukhanov, EM

Citation: Aa. Fedorov et al., An X-ray epitaxial film interferometer as a tool for studying the structure of a semiconductor heterosystem, INSTR EXP R, 43(2), 2000, pp. 271-274