Authors: Jiang, WL Vinnakota, B

Citation: Wl. Jiang et B. Vinnakota, Defect-oriented test scheduling, IEEE VLSI, 9(3), 2001, pp. 427-438

Authors: Vinnakota, B Harjani, R

Citation: B. Vinnakota et R. Harjani, DFT for digital detection of analog parametric faults in SC filters, IEEE COMP A, 19(7), 2000, pp. 789-798

Authors: Jiang, WL Vinnakota, B

Citation: Wl. Jiang et B. Vinnakota, IC test using the energy consumption ratio, IEEE COMP A, 19(1), 2000, pp. 129-141

Authors: Amin, MB Vinnakota, B

Citation: Mb. Amin et B. Vinnakota, Data parallel-fault simulation, IEEE VLSI, 7(2), 1999, pp. 183-190