Citation: H. Wormeester et al., ISOTROPIC AND ANISOTROPIC CONTRIBUTIONS TO THE OPTICAL REFLECTION OF SI(001)-2X1, Physical review. B, Condensed matter, 56(7), 1997, pp. 3617-3620
Authors:
WENTINK DJ
KUIJPER M
WORMEESTER H
VANSILFHOUT A
Citation: Dj. Wentink et al., BROAD-SPECTRUM OPTICAL-PHASE RETARDER USING 3 METALLIC MIRRORS FOR NORMAL AND BREWSTER ANGLE OF INCIDENCE ELLIPSOMETRY, Review of scientific instruments, 67(5), 1996, pp. 1947-1950
Authors:
WORMEESTER H
WENTINK DJ
DEBOEIJ PL
WIJERS CMJ
VANSILFHOUT A
Citation: H. Wormeester et al., SURFACE-STATES OF THE CLEAN AND OXIDIZED GE(001) SURFACE STUDIED WITHNORMAL-INCIDENCE ELLIPSOMETRY, Physical review. B, Condensed matter, 47(19), 1993, pp. 12663-12671
Citation: Cmj. Wijers et al., FULL MICROSCOPIC TREATMENT OF THE OPTICAL-RESPONSE OF THE SI(100) 2X1SURFACE, Thin solid films, 233(1-2), 1993, pp. 28-31