Authors: NORMAND E WERT JL OBERG DL MAJEWSKI PP VOSS P WENDER SA

Citation: E. Normand et al., NEUTRON-INDUCED SINGLE EVENT BURNOUT IN HIGH-VOLTAGE ELECTRONICS, IEEE transactions on nuclear science, 44(6), 1997, pp. 2358-2366

Authors: OBERG DL WERT JL NORMAND E MAJEWSKI PP WENDER SA

Citation: Dl. Oberg et al., FIRST OBSERVATIONS OF POWER MOSFET BURNOUT WITH HIGH-ENERGY NEUTRONS, IEEE transactions on nuclear science, 43(6), 1996, pp. 2913-2920

Authors: NORMAND E OBERG DL WERT JL MAJEWSKI PP WOFFINDEN GA SATOH S SASAKI K TVERSKOY MG MIROSHKIN VV GOLEMINOV N WENDER SA GAVRON A

Citation: E. Normand et al., COMPARISON AND IMPLICATIONS OF CHARGE COLLECTION MEASUREMENTS IN SILICON AND INGAAS IRRADIATED BY ENERGETIC PROTONS AND NEUTRONS, IEEE transactions on nuclear science, 42(6), 1995, pp. 1815-1822

Authors: NORMAND E OBERG DL WERT JL NESS JD MAJEWSKI PP WENDER S GAVRON A

Citation: E. Normand et al., SINGLE EVENT UPSET AND CHARGE COLLECTION MEASUREMENTS USING HIGH-ENERGY PROTONS AND NEUTRONS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2203-2209