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Results:
1-16
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Results: 16
Authors:
TUROS A
WIERZCHOWSKI W
WIETESKA K
WENDLER E
WESCH W
GRAEFF W
GROTZSCHEL R
STRUPINSKI W
Citation: A. Turos et al., ION-BOMBARDMENT INDUCED RELAXATION OF STRAINED ALGAAS GAAS HETEROSTRUCTURES STUDIED BY THE COMPLEMENTARY USE OF RBS-CHANNELING AND X-RAY SYNCHROTRON-RADIATION/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1062-1067
Authors:
WIETESKA K
WIERZCHOWSKI W
GRAEFF W
DLUZEWSKA KD
Citation: K. Wieteska et al., X-RAY-DIFFRACTION PATTERNS IN HIGH-ENERGY PROTON-IMPLANTED SILICON, Physica status solidi. a, Applied research, 168(1), 1998, pp. 11-25
Authors:
WIERZCHOWSKI W
WIETESKA K
GRAEFF W
Citation: W. Wierzchowski et al., SYNCHROTRON WHITE-BEAM TOPOGRAPHIC STUDIES OF GALLIUM-ARSENIDE CRYSTALS, Acta Physica Polonica. A, 91(5), 1997, pp. 1015-1019
Authors:
WIETESKA K
WIERZCHOWSKI W
GRAEFF W
DLUZEWSKA K
Citation: K. Wieteska et al., INTERFERENCE-FRINGES IN SYNCHROTRON SECTION TOPOGRAPHY OF IMPLANTED SILICON WITH A VERY LARGE ION RANGE, Acta Physica Polonica. A, 91(5), 1997, pp. 1021-1024
Authors:
WIERZCHOWSKI W
WIETESKA K
GRAEFF W
Citation: W. Wierzchowski et al., THE IMAGES OF MISFIT DISLOCATIONS IN BRAGG-CASE SYNCHROTRON SECTION TOPOGRAPHY, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 227-232
Authors:
WIETESKA K
WIERZCHOWSKI W
GRAEFF W
Citation: K. Wieteska et al., INTERFERENCE EFFECTS IN BRAGG-CASE SYNCHROTRON SECTION TOPOGRAPHY OF ELASTICALLY BENT SILICON IMPLANTED CRYSTALS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 233-239
Authors:
GAZDA A
WARMUZEK M
WIERZCHOWSKI W
Citation: A. Gazda et al., DTA INVESTIGATION OF THE RETROGRESSION AND RE-AGING IN SOME ALZNMGCU ALLOYS, Thermochimica acta, 303(2), 1997, pp. 197-202
Authors:
WIETESKA K
WIERZCHOWSKI W
GRAEFF W
Citation: K. Wieteska et al., BRAGG-CASE SYNCHROTRON SECTION TOPOGRAPHY OF SILICON IMPLANTED WITH HIGH-ENERGY PROTONS AND ALPHA-PARTICLES, Journal of applied crystallography, 30, 1997, pp. 238-243
Authors:
WIERZCHOWSKI W
MAZUR K
STRUPINSKI W
WIETESKA K
GRAEFF W
Citation: W. Wierzchowski et al., INVESTIGATION OF MISFIT DISLOCATION SOURCES IN GAAS EPITAXIAL LAYERS, Acta Physica Polonica. A, 89(3), 1996, pp. 341-346
Authors:
WIETESKA K
DLUZEWSKA K
WIERZCHOWSKI W
Citation: K. Wieteska et al., LATTICE DEFORMATION STUDIES IN SILICON IMPLANTED WITH HIGH-ENERGY PROTONS, Acta Physica Polonica. A, 89(3), 1996, pp. 395-400
Authors:
WIERZCHOWSKI W
MOORE M
Citation: W. Wierzchowski et M. Moore, BRAGG-CASE IMAGES OF STACKING-FAULTS, Acta crystallographica. Section A, Foundations of crystallography, 51, 1995, pp. 831-840
Authors:
WIERZCHOWSKI W
MAZUR K
WIETESKA K
Citation: W. Wierzchowski et al., NUMERICAL-SIMULATION OF BRAGG-CASE TOPOGRAPHIC IMAGES OF DISLOCATIONSAND PRECIPITATES IN GAAS EPITAXIAL LAYERS, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 33-37
Authors:
WIETESKA K
WIERZCHOWSKI W
Citation: K. Wieteska et W. Wierzchowski, THE TRANSMISSION DIFFRACTION PATTERNS OF SILICON IMPLANTED WITH HIGH-ENERGY ALPHA-PARTICLES, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 74-77
Authors:
MAZUR K
WIERZCHOWSKI W
Citation: K. Mazur et W. Wierzchowski, X-RAY TOPOGRAPHIC INVESTIGATION OF GROWTH DEFECTS AND LATTICE-PARAMETER MEASUREMENTS WITHIN CRYSTALS OF HEAVILY NEODYMIUM-DOPED YTTRIUM-ALUMINUM-GARNET, Journal of crystal growth, 148(4), 1995, pp. 345-354
Authors:
MOORE M
LANG AR
WIERZCHOWSKI W
Citation: M. Moore et al., STEREOSCOPIC OBSERVATION OF SYNTHETIC DIAMOND WITH HARUTA STEREO-PAIRS OF SYNCHROTRON TRANSMISSION DOUBLE-CRYSTAL TOPOGRAPHS, Acta Physica Polonica. A, 86(4), 1994, pp. 613-616
Authors:
WIERZCHOWSKI W
MAZUR K
Citation: W. Wierzchowski et K. Mazur, X-RAY TOPOGRAPHIC INVESTIGATION OF CELLULAR STRUCTURE AND ITS RELATION TO ANOTHER DEFECTS IN VARIOUS TYPES OF GAAS SINGLE-CRYSTALS, Acta Physica Polonica. A, 84(4), 1993, pp. 789-794
Risultati:
1-16
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