Authors: WOKULSKA K

Citation: K. Wokulska, THERMAL-EXPANSION OF WHISKERS OF TI(C,N) SOLID-SOLUTIONS, Journal of alloys and compounds, 264(1-2), 1998, pp. 223-227

Authors: OKONSKAKOZLOWSKA I MACIAZEK E WOKULSKA K HEIMANN J

Citation: I. Okonskakozlowska et al., GROWTH OF CUXIN2 3(1-X)CR2SE4 4-ELEMENT SINGLE-CRYSTALS BY CHEMICAL-VAPOR TRANSPORT AND THEIR PROPERTIES/, Journal of alloys and compounds, 219, 1995, pp. 97-99

Authors: OKONSKAKOZLOWSKA I JENDRZEJEWSKA I WOKULSKA K

Citation: I. Okonskakozlowska et al., THE SINGLE-CRYSTALS CU1-XZNXCR2SE4, Journal of alloys and compounds, 219, 1995, pp. 100-102

Authors: HARTWIG J HOLZER G FORSTER E GOETZ K WOKULSKA K WOLF J

Citation: J. Hartwig et al., REMEASUREMENT OF CHARACTERISTIC X-RAY-EMISSION LINES AND THEIR APPLICATION TO LINE-PROFILE ANALYSIS AND LATTICE-PARAMETER DETERMINATION, Physica status solidi. a, Applied research, 143(1), 1994, pp. 23-34

Authors: HARTWIG J BAKMISIUK J BERGER H BRUHL HG OKADA Y GROSSWIG S WOKULSKA K WOLF J

Citation: J. Hartwig et al., COMPARISON OF LATTICE-PARAMETERS OBTAINED FROM AN INTERNAL SILICON MONOCRYSTAL STANDARD, Physica status solidi. a, Applied research, 142(1), 1994, pp. 19-26