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Results: 1-20 |
Results: 20
EPITAXIAL INSULATING FILMS
Authors: HENZLER M ZIELASEK V ERDOS D WOLLSCHLAGER J
Citation: M. Henzler et al., EPITAXIAL INSULATING FILMS, Surface review and letters, 5(3-4), 1998, pp. 675-684
STRAIN RELIEF VIA ISLAND RAMIFICATION IN SUBMONOLAYER HETEROEPITAXY
Authors: MULLER B NEDELMANN LP FISCHER B BRUNE H BARTH JV KERN K ERDOS D WOLLSCHLAGER J
Citation: B. Muller et al., STRAIN RELIEF VIA ISLAND RAMIFICATION IN SUBMONOLAYER HETEROEPITAXY, Surface review and letters, 5(3-4), 1998, pp. 769-781
COMPETITION BETWEEN TERRACE AND STEP NUCLEATION - EPITAXY OF CAF2 ON VICINAL SI(111) STUDIED BY ATOMIC-FORCE MICROSCOPY
Authors: WOLLSCHLAGER J PIETSCH H KLUST A
Citation: J. Wollschlager et al., COMPETITION BETWEEN TERRACE AND STEP NUCLEATION - EPITAXY OF CAF2 ON VICINAL SI(111) STUDIED BY ATOMIC-FORCE MICROSCOPY, Applied surface science, 132, 1998, pp. 29-35
INHOMOGENEOUS GROWTH OF CAF2 ADLAYERS ON SI(111) AT INTERMEDIATE TEMPERATURES
Authors: WOLLSCHLAGER J KLUST A PIETSCH H
Citation: J. Wollschlager et al., INHOMOGENEOUS GROWTH OF CAF2 ADLAYERS ON SI(111) AT INTERMEDIATE TEMPERATURES, Applied surface science, 123, 1998, pp. 496-500
DIFFRACTION CHARACTERIZATION OF ROUGH FILMS FORMED UNDER STABLE AND UNSTABLE GROWTH-CONDITIONS
Authors: WOLLSCHLAGER J LUO EZ HENZLER M
Citation: J. Wollschlager et al., DIFFRACTION CHARACTERIZATION OF ROUGH FILMS FORMED UNDER STABLE AND UNSTABLE GROWTH-CONDITIONS, Physical review. B, Condensed matter, 57(24), 1998, pp. 15541-15552
DIFFRACTION FROM 2-DIMENSIONAL VICINAL SURFACES WITH NONCOLLIDING MEANDERING STEPS
Authors: WOLLSCHLAGER J LARSSON M
Citation: J. Wollschlager et M. Larsson, DIFFRACTION FROM 2-DIMENSIONAL VICINAL SURFACES WITH NONCOLLIDING MEANDERING STEPS, Physical review. B, Condensed matter, 57(23), 1998, pp. 14937-14949
THE FORMATION OF MOSAICS DURING THE REACTIVE GROWTH OF MGO FILMS ON AG(100)
Authors: WOLLSCHLAGER J ERDOS D SCHRODER KM
Citation: J. Wollschlager et al., THE FORMATION OF MOSAICS DURING THE REACTIVE GROWTH OF MGO FILMS ON AG(100), Surface science, 404(1-3), 1998, pp. 272-276
DIFFRACTION SPOT PROFILE ANALYSIS FOR VICINAL SURFACES WITH LONG-RANGE ORDER
Authors: WOLLSCHLAGER J SCHAFER F SCHRODER KM
Citation: J. Wollschlager et al., DIFFRACTION SPOT PROFILE ANALYSIS FOR VICINAL SURFACES WITH LONG-RANGE ORDER, Surface science, 396(1-3), 1998, pp. 94-106
GROWTH OF CAF2 ON SI(111) - IMAGING OF THE CAF INTERFACE BY FRICTION FORCE MICROSCOPY
Authors: KLUST A PIETSCH H WOLLSCHLAGER J
Citation: A. Klust et al., GROWTH OF CAF2 ON SI(111) - IMAGING OF THE CAF INTERFACE BY FRICTION FORCE MICROSCOPY, Applied physics letters, 73(14), 1998, pp. 1967-1969
THERMAL ROUGHENING OF UNCORRELATED STEPS
Authors: LARSSON MI TRINGIDES M FRISCHAT H WOLLSCHLAGER J
Citation: Mi. Larsson et al., THERMAL ROUGHENING OF UNCORRELATED STEPS, Surface science, 387(1-3), 1997, pp. 142-151
SIMPLE ANALYSIS OF SPOT SPLITTING DUE TO DIFFRACTION AT SURFACES WITHATOMIC STEPS
Authors: WOLLSCHLAGER J
Citation: J. Wollschlager, SIMPLE ANALYSIS OF SPOT SPLITTING DUE TO DIFFRACTION AT SURFACES WITHATOMIC STEPS, Surface science, 383(1), 1997, pp. 103-122
PROPERTIES OF KINKS IN VICINAL FACE-CENTERED-CUBIC (111)SURFACES
Authors: LARSSON MI FRISCHAT H WOLLSCHLAGER J TRINGIDES MC
Citation: Mi. Larsson et al., PROPERTIES OF KINKS IN VICINAL FACE-CENTERED-CUBIC (111)SURFACES, Surface science, 381(2-3), 1997, pp. 123-132
GROWTH INSTABILITIES OF CAF2 ADLAYERS DEPOSITED AT HIGH-TEMPERATURE ON SI(111)
Authors: PIETSCH H KLUST A MEIER A WOLLSCHLAGER J
Citation: H. Pietsch et al., GROWTH INSTABILITIES OF CAF2 ADLAYERS DEPOSITED AT HIGH-TEMPERATURE ON SI(111), Surface science, 377(1-3), 1997, pp. 909-913
A COMPARATIVE STM AND SPA-LEED STUDY ON THE EVOLUTION OF STRAIN-INDUCED STRIPE PATTERN ON CU NI(100)/
Authors: NEDELMANN L MULLER B FISCHER B KERN K ERDOS D WOLLSCHLAGER J HENZLER M
Citation: L. Nedelmann et al., A COMPARATIVE STM AND SPA-LEED STUDY ON THE EVOLUTION OF STRAIN-INDUCED STRIPE PATTERN ON CU NI(100)/, Surface science, 376(1-3), 1997, pp. 113-122
DIFFRACTION SPOT PROFILE ANALYSIS FOR HETEROEPITAXIAL SURFACES APPLIED TO THE INITIAL GROWTH-STAGES OF CAF2 ADLAYERS ON SI(111)
Authors: WOLLSCHLAGER J MEIER A
Citation: J. Wollschlager et A. Meier, DIFFRACTION SPOT PROFILE ANALYSIS FOR HETEROEPITAXIAL SURFACES APPLIED TO THE INITIAL GROWTH-STAGES OF CAF2 ADLAYERS ON SI(111), Applied surface science, 104, 1996, pp. 392-401
FILM AND INTERFACE MORPHOLOGY OF CAF2 GROWN ON SI(111) AT LOW-TEMPERATURE
Authors: WOLLSCHLAGER J MEIER A
Citation: J. Wollschlager et A. Meier, FILM AND INTERFACE MORPHOLOGY OF CAF2 GROWN ON SI(111) AT LOW-TEMPERATURE, Journal of applied physics, 79(9), 1996, pp. 7373-7375
SPA-LEED STUDIES OF GROWTH OF AG ON AG(111) AT LOW-TEMPERATURES
Authors: LUO EZ WOLLSCHLAGER J WEGNER F HENZLER M
Citation: Ez. Luo et al., SPA-LEED STUDIES OF GROWTH OF AG ON AG(111) AT LOW-TEMPERATURES, Applied physics A: Materials science & processing, 60(1), 1995, pp. 19-25
MISFIT ACCOMMODATION IN HETEROEPITAXY BY INCLINED STACKING-FAULTS
Authors: HENZLER M HOMANN C MALASKE U WOLLSCHLAGER J
Citation: M. Henzler et al., MISFIT ACCOMMODATION IN HETEROEPITAXY BY INCLINED STACKING-FAULTS, Physical review. B, Condensed matter, 52(24), 1995, pp. 17060-17062
DIFFRACTION FROM SURFACES WITH RANDOMLY DISTRIBUTED STRUCTURAL DEFECTS
Authors: WOLLSCHLAGER J
Citation: J. Wollschlager, DIFFRACTION FROM SURFACES WITH RANDOMLY DISTRIBUTED STRUCTURAL DEFECTS, Surface science, 328(3), 1995, pp. 325-336
SURFACE-ROUGHNESS AND CONDUCTIVITY OF THIN AG FILMS
Authors: LUO EZ HEUN S KENNEDY M WOLLSCHLAGER J HENZLER M
Citation: Ez. Luo et al., SURFACE-ROUGHNESS AND CONDUCTIVITY OF THIN AG FILMS, Physical review. B, Condensed matter, 49(7), 1994, pp. 4858-4865
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