Authors: FRANK DJ TAUR Y WONG HSP

Citation: Dj. Frank et al., GENERALIZED SCALE LENGTH FOR 2-DIMENSIONAL EFFECTS IN MOSFETS, IEEE electron device letters, 19(10), 1998, pp. 385-387

Authors: WONG HSP TAUR Y FRANK DJ

Citation: Hsp. Wong et al., DISCRETE RANDOM DOPANT DISTRIBUTION EFFECTS IN NANOMETER-SCALE MOSFETS, Microelectronics and reliability, 38(9), 1998, pp. 1447-1456

Authors: SELMI L PAVESI M WONG HSP ACOVIC A SANGIORGI E

Citation: L. Selmi et al., MONITORING HOT-CARRIER DEGRADATION IN SOI MOSFETS BY HOT-CARRIER LUMINESCENCE TECHNIQUES, I.E.E.E. transactions on electron devices, 45(5), 1998, pp. 1135-1139

Authors: WONG HSP CHANG RT CRABBE E AGNELLO PD

Citation: Hsp. Wong et al., CMOS ACTIVE PIXEL IMAGE SENSORS FABRICATED USING A 1.8-V, 0.25-MU-M CMOS TECHNOLOGY, I.E.E.E. transactions on electron devices, 45(4), 1998, pp. 889-894