ACNP - Italian Periodicals Catalogue

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Results: 1-14 |

Results: 14

TEMPERATURE-DEPENDENCE OF THE 4-EV OPTICAL-TRANSITION IN YBA2CU3O6

Authors: BIJLSMA ME WORMEESTER H BLANK DHA SPAN E VANSILFHOUT A ROGALLA H

Citation: Me. Bijlsma et al., TEMPERATURE-DEPENDENCE OF THE 4-EV OPTICAL-TRANSITION IN YBA2CU3O6, Physical review. B, Condensed matter, 57(21), 1998, pp. 13418-13421

AU ON W(001) - CHANGE IN STRUCTURE AND ORIENTATION

Authors: WORMEESTER H HUGER E BAUER E

Citation: H. Wormeester et al., AU ON W(001) - CHANGE IN STRUCTURE AND ORIENTATION, Physical review. B, Condensed matter, 57(16), 1998, pp. 10120-10131

IN-SITU SPECTROSCOPIC ELLIPSOMETRIC INVESTIGATION OF VACUUM ANNEALED AND OXIDIZED POROUS SILICON LAYERS

Authors: FRIED M WORMEESTER H ZOETHOUT E LOHNER T POLGAR O BARSONY I

Citation: M. Fried et al., IN-SITU SPECTROSCOPIC ELLIPSOMETRIC INVESTIGATION OF VACUUM ANNEALED AND OXIDIZED POROUS SILICON LAYERS, Thin solid films, 313, 1998, pp. 459-463

IMPORTANCE OF THE SURFACE ELECTRONIC-STRUCTURE IN HETEROEPITAXY

Authors: WORMEESTER H HUGER E BAUER E

Citation: H. Wormeester et al., IMPORTANCE OF THE SURFACE ELECTRONIC-STRUCTURE IN HETEROEPITAXY, Physical review letters, 81(4), 1998, pp. 854-857

IN-SITU GROWTH-STUDIES OF SPUTTERED YBCO THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY

Authors: BIJLSMA ME BLANK DHA WORMEESTER H VANSILFHOUT A ROGALLA H

Citation: Me. Bijlsma et al., IN-SITU GROWTH-STUDIES OF SPUTTERED YBCO THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY, Journal of alloys and compounds, 251(1-2), 1997, pp. 15-18

ISOTROPIC AND ANISOTROPIC CONTRIBUTIONS TO THE OPTICAL REFLECTION OF SI(001)-2X1

Authors: WORMEESTER H WENTINK DJ VANSILFHOUT A

Citation: H. Wormeester et al., ISOTROPIC AND ANISOTROPIC CONTRIBUTIONS TO THE OPTICAL REFLECTION OF SI(001)-2X1, Physical review. B, Condensed matter, 56(7), 1997, pp. 3617-3620

ETCHING BEHAVIOR OF SI(001)-2X1 STUDIED WITH OPTICAL ANISOTROPY

Authors: WENTINK DJ KUIJPER M WORMEESTER H VANSILFHOUT A

Citation: Dj. Wentink et al., ETCHING BEHAVIOR OF SI(001)-2X1 STUDIED WITH OPTICAL ANISOTROPY, Physical review. B, Condensed matter, 56(12), 1997, pp. 7679-7686

GROWTH OF HCP CU ON W(100)

Authors: WORMEESTER H KIENE ME HUGER E BAUER E

Citation: H. Wormeester et al., GROWTH OF HCP CU ON W(100), Surface science, 377(1-3), 1997, pp. 988-991

SURFACE DISORDER PRODUCTION DURING PLASMA IMMERSION IMPLANTATION AND HIGH-ENERGY ION-IMPLANTATION

Authors: ELSHERBINY MA KHANH NQ WORMEESTER H FRIED M LOHNER T PINTER I GYULAI J

Citation: Ma. Elsherbiny et al., SURFACE DISORDER PRODUCTION DURING PLASMA IMMERSION IMPLANTATION AND HIGH-ENERGY ION-IMPLANTATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 728-732

GROWTH AND ELECTRONIC-STRUCTURE OF THIN EPITAXIAL PD AND CO FILMS ON W(100)

Authors: WORMEESTER H HUGER E BAUER E

Citation: H. Wormeester et al., GROWTH AND ELECTRONIC-STRUCTURE OF THIN EPITAXIAL PD AND CO FILMS ON W(100), Physical review. B, Condensed matter, 54(23), 1996, pp. 17108-17117

BROAD-SPECTRUM OPTICAL-PHASE RETARDER USING 3 METALLIC MIRRORS FOR NORMAL AND BREWSTER ANGLE OF INCIDENCE ELLIPSOMETRY

Authors: WENTINK DJ KUIJPER M WORMEESTER H VANSILFHOUT A

Citation: Dj. Wentink et al., BROAD-SPECTRUM OPTICAL-PHASE RETARDER USING 3 METALLIC MIRRORS FOR NORMAL AND BREWSTER ANGLE OF INCIDENCE ELLIPSOMETRY, Review of scientific instruments, 67(5), 1996, pp. 1947-1950

HCP AND BCC CU AND PD FILMS

Authors: WORMEESTER H HUGER E BAUER E

Citation: H. Wormeester et al., HCP AND BCC CU AND PD FILMS, Physical review letters, 77(8), 1996, pp. 1540-1543

SURFACE-STATES OF THE CLEAN AND OXIDIZED GE(001) SURFACE STUDIED WITHNORMAL-INCIDENCE ELLIPSOMETRY

Authors: WORMEESTER H WENTINK DJ DEBOEIJ PL WIJERS CMJ VANSILFHOUT A

Citation: H. Wormeester et al., SURFACE-STATES OF THE CLEAN AND OXIDIZED GE(001) SURFACE STUDIED WITHNORMAL-INCIDENCE ELLIPSOMETRY, Physical review. B, Condensed matter, 47(19), 1993, pp. 12663-12671

OPTICAL ANISOTROPY OF GE(001)

Authors: WORMEESTER H WENTINK DJ DEBOEIJ PL VANSILFHOUT A

Citation: H. Wormeester et al., OPTICAL ANISOTROPY OF GE(001), Thin solid films, 233(1-2), 1993, pp. 14-18

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