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Results:
1-16
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Results: 16
Authors:
Pritzkow, W
Vogl, J
Berger, A
Ecker, K
Grotzschel, R
Klingbeil, P
Persson, L
Riebe, G
Watjen, U
Citation: W. Pritzkow et al., Contribution of ICP-IDMS to the certification of antimony implanted in a silicon wafer - comparison with RBS and INAA results, FRESEN J AN, 371(6), 2001, pp. 867-873
Authors:
Friese, KC
Watjen, U
Grobecker, KH
Citation: Kc. Friese et al., Analyte transport efficiencies in electrothermal vaporization for inductively coupled plasma mass spectrometry, FRESEN J AN, 370(7), 2001, pp. 843-849
Authors:
Friese, KC
Grobecker, KH
Watjen, U
Citation: Kc. Friese et al., Development of an electrothermal vaporization ICP-MS method and assessmentof its applicability to studies of the homogeneity of reference materials, FRESEN J AN, 370(5), 2001, pp. 499-507
Authors:
Chukalina, MV
Watjen, U
Citation: Mv. Chukalina et U. Watjen, Mathematical reconstruction of sample microstructures obtained from PIXE elemental maps, NUCL INST B, 181, 2001, pp. 249-253
Authors:
Ecker, KH
Berger, A
Grotzschel, R
Persson, L
Watjen, U
Citation: Kh. Ecker et al., Antimony implanted in silicon - A thin layer reference material for surface analysis, NUCL INST B, 175, 2001, pp. 797-801
Authors:
Sjoland, KA
Munnik, F
Watjen, U
Citation: Ka. Sjoland et al., Thick-target correction in PIXE for randomly inhomogeneous samples, NUCL INST B, 161, 2000, pp. 264-268
Authors:
Sjoland, KA
Munnik, F
Watjen, U
Citation: Ka. Sjoland et al., Uncertainty budget for ion beam analysis, NUCL INST B, 161, 2000, pp. 275-280
Authors:
Munnik, F
Sjoland, KA
Watjen, U
Citation: F. Munnik et al., Using microprobe distribution maps to determine homogeneity and correlation between elements, NUCL INST B, 161, 2000, pp. 348-353
Authors:
Watjen, U
Ducso, C
Tajani, A
Munnik, F
Lechtenberg, F
Citation: U. Watjen et al., A novel micro-structured reference material for microbeam analysis, NUCL INST B, 161, 2000, pp. 359-365
Authors:
Persson, L
Lovestam, NG
Sodervall, U
Watjen, U
Citation: L. Persson et al., Comparative study of RBS, SIMS and VASE for characterisation of high electron mobility transistors, NUCL INST B, 161, 2000, pp. 482-486
Authors:
Watjen, U
Barsony, I
Ducso, C
Citation: U. Watjen et al., A novel micro-structured reference material for ion and X-ray microbeam analysis, MIKROCH ACT, 132(2-4), 2000, pp. 521-525
Authors:
Munnik, F
Sjoland, KA
Vittiglio, G
Ingelbrecht, C
Watjen, U
Citation: F. Munnik et al., Nuclear microprobe study of metal segregation in quaternary bronze, NUCL INST B, 158(1-4), 1999, pp. 281-286
Authors:
Sjoland, KA
Munnik, F
Chaves, C
Watjen, U
Citation: Ka. Sjoland et al., Time-resolved pile-up compensation in PIXE analysis with list-mode collected data, NUCL INST B, 150(1-4), 1999, pp. 69-75
Authors:
Watjen, U
Barsony, I
Grime, GW
Rajta, I
Citation: U. Watjen et al., On the interpretation of micro-PIXE measurements on a prototype microstructured reference material, NUCL INST B, 150(1-4), 1999, pp. 532-537
Authors:
Gamaz, F
Chaves, C
Watjen, U
Citation: F. Gamaz et al., Homogeneity study of an Fe impurity in unalloyed Zn using PIXE, NUCL INST B, 150(1-4), 1999, pp. 559-564
Authors:
Munnik, F
Vakevainen, K
Raisanen, J
Watjen, U
Citation: F. Munnik et al., Stopping power measurements of 0.5-10.5 MeV Li-7 ions in polyimide, vyns, formvar, and polysulfone, J APPL PHYS, 86(7), 1999, pp. 3934-3938
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