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Results:
1-9
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Results: 9
Authors:
Li, B
Martin, S
Welsch, E
Citation: B. Li et al., Laser conditioning and nonlinear absorption of LaF3/MgF2 dielectric multilayers at 193 nm, APPL PHYS A, 74(1), 2002, pp. 27-33
Authors:
Li, BC
Theobald, W
Welsch, E
Sauerbrey, R
Citation: Bc. Li et al., Optimization of grating size in chirped-pulse-amplification laser system, APP PHYS B, 71(6), 2000, pp. 819-826
Authors:
Li, BC
Pottier, L
Roger, JP
Fournier, D
Welsch, E
Citation: Bc. Li et al., Thermal characterization of film-on-substrate systems with modulated thermoreflectance microscopy, REV SCI INS, 71(5), 2000, pp. 2154-2160
Authors:
Li, BC
Martin, S
Welsch, E
Citation: Bc. Li et al., In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens, APPL OPTICS, 39(25), 2000, pp. 4690-4697
Authors:
Welsch, E
Ettrich, K
Ristau, D
Willamowski, U
Citation: E. Welsch et al., Absolute measurement of thermophysical and optical thin-film properties byphotothermal methods for the investigation of laser damage, INT J THERM, 20(3), 1999, pp. 965-976
Authors:
Li, BC
Martin, S
Welsch, E
Citation: Bc. Li et al., Pulsed top-hat beam thermal-lens measurement for ultraviolet dielectric coatings, OPTICS LETT, 24(20), 1999, pp. 1398-1400
Authors:
Hehl, K
Bischoff, J
Mohaupt, U
Palme, M
Schnabel, B
Wenke, L
Bodefeld, R
Theobald, W
Welsch, E
Sauerbrey, R
Heyer, H
Citation: K. Hehl et al., High-efficiency dielectric reflection gratings: design, fabrication, and analysis, APPL OPTICS, 38(30), 1999, pp. 6257-6271
Authors:
Li, BC
Welsch, E
Citation: Bc. Li et E. Welsch, Probe-beam diffraction in a pulsed top-hat beam thermal lens with a mode-mismatched configuration, APPL OPTICS, 38(24), 1999, pp. 5241-5249
Authors:
Willamowski, U
Ristau, D
Welsch, E
Citation: U. Willamowski et al., Measuring the absolute absorptance of optical laser components, APPL OPTICS, 37(36), 1998, pp. 8362-8370
Risultati:
1-9
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