Authors:
Tiwari, S
Wahl, JA
Silva, H
Rana, F
Welser, JJ
Citation: S. Tiwari et al., Small silicon memories: confinement, single-electron, and interface state considerations, APPL PHYS A, 71(4), 2000, pp. 403-414
Citation: Ct. Black et Jj. Welser, Electric-field penetration into metals: Consequences for high-dielectric-constant capacitors, IEEE DEVICE, 46(4), 1999, pp. 776-780