Citation: Jk. Bu et Mh. White, Effects of two-step high temperature deuterium anneals on SONOS nonvolatile memory devices, IEEE ELEC D, 22(1), 2001, pp. 17-19
Citation: Jk. Bu et Mh. White, Electrical characterization of ONO triple dielectric in SONOS nonvolatile memory devices, SOL ST ELEC, 45(1), 2001, pp. 47-51
Authors:
Wingard, JR
White, MH
Anaissie, E
Raffalli, J
Goodman, J
Arrieta, A
Citation: Jr. Wingard et al., A randomized, double-blind comparative trial evaluating the safety of liposomal amphotericin B versus amphotericin B lipid complex in the empirical treatment of febrile neutropenia, CLIN INF D, 31(5), 2000, pp. 1155-1163
Citation: Yl. Yang et Mh. White, Charge retention of scaled SONOS nonvolatile memory devices at elevated temperatures, SOL ST ELEC, 44(6), 2000, pp. 949-958
Citation: Vr. Vathulya et Mh. White, Characterization and performance comparison of the power DIMOS structure fabricated with a reduced thermal budget in 4H and 6H-SiC, SOL ST ELEC, 44(2), 2000, pp. 309-315
Citation: Vr. Vathulya et Mh. White, Characterization of inversion and accumulation layer electron transport in4H and 6H-SiC MOSFETs on implanted p-type regions, IEEE DEVICE, 47(11), 2000, pp. 2018-2023
Citation: Mh. White, Amphotericin B colloidal dispersion versus amphotericin B in the empiricaltreatment of fever and neutropenia - Reply, CLIN INF D, 28(4), 1999, pp. 935-936