Citation: Dk. Wilkinson et al., Nondestructive angle-resolved X-ray depth profiling: Interpretation of angle-resolved profiles using a Monte Carlo approach, MICROS MICR, 6(6), 2000, pp. 517-531
Authors:
Wilkinson, DK
El-Gomati, M
Prutton, M
Cooke, GA
Dowsett, MG
Smith, NS
Citation: Dk. Wilkinson et al., Study of altered layer formation in O-2(+)-bombarded SiGe alloys using a novel crossed bevel technique, SURF INT AN, 27(9), 1999, pp. 840-848