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Results: 26-38/38
Authors:
WANG DZ
WANG X
YANG GQ
LIU XH
JIA YB
ZHOU G
LI GF
Citation: Dz. Wang et al., PHASES AND STRUCTURES OF NANOCRYSTALLINE TIN FILMS, Journal of applied physics, 77(7), 1995, pp. 2945-2951
Authors:
WEI F
YANG GQ
JIN Y
YU ZQ
Citation: F. Wei et al., THE CHARACTERISTICS OF CLUSTER IN A HIGH-DENSITY CIRCULATING FLUIDIZED-BED, Canadian journal of chemical engineering, 73(5), 1995, pp. 650-655
Authors:
WANG HZ
ZHENG XG
MAO WD
GAO ZL
YANG GQ
WANG PF
WU SK
Citation: Hz. Wang et al., EFFICIENT UP-CONVERSION FLUORESCENCE IN CHARGE-TRANSFER COMPOUND CRYSTAL, Applied physics letters, 66(21), 1995, pp. 2777-2779
Authors:
JIA ZM
YANG GQ
CHENG ZN
LIU XH
ZOU SC
Citation: Zm. Jia et al., THE 2-DIMENSIONAL PAIR CORRELATION-FUNCTION FOR THE SI(001) SURFACE -COMPUTER-SIMULATION RESULTS, Journal of physics. Condensed matter, 6(6), 1994, pp. 1083-1088
Authors:
WENG HM
WANG DZ
HAN RD
JIANG Y
YANG GQ
LIU XH
Citation: Hm. Weng et al., LOW-ENERGY POSITRON BEAM STUDIES OF NANO-TIN FILMS, Materials science & engineering. B, Solid-state materials for advanced technology, 26(2-3), 1994, pp. 163-166
Authors:
CHING ZY
ZHU J
LIU XH
WANG X
YANG GQ
Citation: Zy. Ching et al., INVESTIGATION USING TRANSMISSION ELECTRON-MICROSCOPY OF THE MICROSTRUCTURE OF TIN FILM FORMED BY ION-BEAM-ENHANCED DEPOSITION UNDER 90 KEV XE+ BOMBARDMENT ON AN SI SUBSTRATE, Surface & coatings technology, 66(1-3), 1994, pp. 323-325
Authors:
YANG GQ
WANG DZ
LIU XH
WANG X
ZOU SC
Citation: Gq. Yang et al., FORMATION OF NANOCRYSTALLINE TIN FILM BY ION-BEAM-ENHANCED DEPOSITION, Surface & coatings technology, 65(1-3), 1994, pp. 214-218
Authors:
LOHNER T
TOTH Z
FRIED M
KHANH NQ
YANG GQ
LU LC
ZOU SC
HANEKAMP LJ
VANSILFHOUT A
GYULAI J
Citation: T. Lohner et al., COMPARATIVE INVESTIGATION OF DAMAGE-INDUCED BY DIATOMIC AND MONOATOMIC ION-IMPLANTATION IN SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 524-527
Authors:
LIN CL
ZHOU ZY
HEMMENT PLF
LI XQ
YANG GQ
ZHU WH
ZOU SC
Citation: Cl. Lin et al., GRAZING-ANGLE RBS AND CHANNELING ANALYSIS OF BF2+ IMPLANTATION DAMAGEIN SILICON, Physica status solidi. a, Applied research, 142(2), 1994, pp. 365-370
Authors:
LIN CL
YANG GQ
FANG ZW
LI XQ
ZOU SC
GYULAI J
ELLIMAN RG
Citation: Cl. Lin et al., DAMAGE ENHANCEMENT EFFECT IN SILICON IMPLANTED WITH MOLECULAR-IONS, Science in China. Series A, Mathematics, Physics, Astronomy & Technological Sciences, 36(2), 1993, pp. 235-242
Authors:
LIU XH
ZHENG ZH
HUANG W
LIN ZX
WANG X
YANG GQ
ZOU SC
Citation: Xh. Liu et al., INFLUENCE OF ION-BEAM MODIFICATION ON THE OXIDATION BEHAVIOR OF INTERMETALLIC COMPOUND NI3AL(0.1B), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 11(6), 1993, pp. 2938-2940
EFFECT OF MG SEGREGATION AT GRAIN-BOUNDARIES ON CORROSION BEHAVIOR OFINTERMETALLIC COMPOUND NI3AL(B)
Authors:
LIU XH
JIAN BY
WANG X
YANG GQ
ZOU SC
SUN J
SCHROER A
ENSINGER W
WOLF GK
KALBITZER S
TAKAHASHI K
IWAKI M
TANIGUCHI S
Citation: Xh. Liu et al., EFFECT OF MG SEGREGATION AT GRAIN-BOUNDARIES ON CORROSION BEHAVIOR OFINTERMETALLIC COMPOUND NI3AL(B), Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 221-224
Authors:
WANG X
LIU XH
YANG GQ
ZHENG ZH
HUANG W
ZOU SH
Citation: X. Wang et al., STRESS BEHAVIOR OF TIN FILMS FORMED BY REACTIVE ION-BEAM-ASSISTED DEPOSITION, Materials letters, 16(4), 1993, pp. 185-188