Authors: DOMASHEVSKAYA EP YURAKOV YA BODNAR DM KASHKAROV VM

Citation: Ep. Domashevskaya et al., USXES INVESTIGATIONS OF THIN-FILM TISI2, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 963-967

Authors: DOMASHEVSKAYA EP YURAKOV YA KASHKAROV VM

Citation: Ep. Domashevskaya et al., SILICIDE FORMATION IN THIN-FILM PT-SI(111) STRUCTURE BY USXES DATA, Thin solid films, 298(1-2), 1997, pp. 135-137

Authors: DOMASHEVSKAYA EP YURAKOV YA VELIGURA GA BOCHAROV SA

Citation: Ep. Domashevskaya et al., AES AND USXES INVESTIGATIONS OF THE PHASE-TRANSFORMATION IN THE SURFACE-LAYERS OF V-SI SIO2/SI THIN-FILMS STRUCTURE STIMULATED BY OXYGEN ANNEALING/, Journal of electron spectroscopy and related phenomena, 76, 1995, pp. 511-516