Authors: Vol'pyan, OD Yakovlev, PP Meshkov, BB

Citation: Od. Vol'Pyan et al., Analysis of errors in the photometric monitoring of layer thickness, J OPT TECH, 68(3), 2001, pp. 225-226

Authors: Meshkov, BB Yakovlev, PP

Citation: Bb. Meshkov et Pp. Yakovlev, Obtaining Al2O3 films for optical purposes by ac magnetron sputtering, J OPT TECH, 67(9), 2000, pp. 834-836

Authors: Vol'pyan, OD Obod, YA Yakovlev, PP Meshkov, BB

Citation: Od. Vol'Pyan et al., Influence of bias potential on the optical properties of Nb2O5 films obtained by magnetron sputtering, J OPT TECH, 67(10), 2000, pp. 889-891

Authors: Yakovlev, PP

Citation: Pp. Yakovlev, Expansion of the spectral characteristic of interference polarizers in thenear infrared, J OPT TECH, 67(10), 2000, pp. 920-921

Authors: Yakovlev, PP

Citation: Pp. Yakovlev, Simple method for determining the parameters of optical films, J OPT TECH, 66(2), 1999, pp. 133-134

Authors: Vol'pyan, OD Semenov, AA Yakovlev, PP

Citation: Od. Vol'Pyan et al., Laser reflector with an interference coating, QUANTUM EL, 28(10), 1998, pp. 907-909