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Citation: Jf. Ying et al., Evolution of the corrosion process on thin-film media, J VAC SCI A, 18(4), 2000, pp. 1804-1808

Authors: Wong, BY Ying, JF Johnson, K

Citation: By. Wong et al., Modeling of misfit induced defects in Co/Cr recording media, IEEE MAGNET, 36(5), 2000, pp. 2360-2362

Authors: Ying, JF Sobol, PE Yang, ZD Hermsmeier, BD

Citation: Jf. Ying et al., Angle-resolved X-ray photoelectron spectroscopic study of the interface chemistry between ultra-thin a-C overcoat and the magnetic layer on magnetic thin film disks, J ELEC SPEC, 99, 1999, pp. 209-222

Authors: Chan, DK Misquitta, SF Ying, JF Martner, CC Hermsmeier, BD

Citation: Dk. Chan et al., Chemical depth profiling on submicron regions: a combined focused ion beamscanning electron microscope approach, SURF INT AN, 27(4), 1999, pp. 199-203

Authors: Wong, BY Ying, JF

Citation: By. Wong et Jf. Ying, Cr underlayer lattice modulation through alloying and multi-layer construction, IEEE MAGNET, 35(5), 1999, pp. 2646-2648