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Results: 1-19 |
Results: 19

Authors: DRULIS H FOLCIK L DRULIS M ZALESKI A SULEIMANOV NM
Citation: H. Drulis et al., DETERMINATION OF THE MAGNETIC-FIELD DISTRIBUTION IN THE BI-2212 SUPERCONDUCTING SINGLE-CRYSTAL BY THE SCANNING EPR-PROBE, Acta Physica Polonica. A, 93(2), 1998, pp. 403-407

Authors: IOANNOU DE DUAN FL SINHA SP ZALESKI A
Citation: De. Ioannou et al., OPPOSITE-CHANNEL-BASED INJECTION OF HOT-CARRIERS IN SOI MOSFETS - PHYSICS AND APPLICATIONS, I.E.E.E. transactions on electron devices, 45(5), 1998, pp. 1147-1154

Authors: JABLONKA S MORA C NOWAK PM ZALESKI A
Citation: S. Jablonka et al., THE INFLUENCE OF SOME ORGANIC-COMPOUNDS ON THE RECRYSTALLIZATION OF FINE-GRAIN AGBR EMULSIONS, Journal of information recording, 23(4), 1996, pp. 303-308

Authors: JABLONKA S MORA C NOWAK PM ZALESKI A
Citation: S. Jablonka et al., A PHOTOGRAPHIC TESTING METHOD FOR THE REDUCING PROPERTIES OF GELATINS, Journal of information recording, 23(4), 1996, pp. 309-313

Authors: JABLONKA S MORA C NOWAK PM ZALESKI A
Citation: S. Jablonka et al., SOME ASPECTS OF THE ACTION OF TETRAZAINDENE DERIVATIVES IN THE PHOTOGRAPHIC PROCESS IN AGBR(I) TWIN CRYSTALS, Journal of information recording, 23(3), 1996, pp. 249-254

Authors: SINHA SP ZALESKI A IOANNOU DE CAMPISI GJ HUGHES HL
Citation: Sp. Sinha et al., HOT HOLE INDUCED INTERFACE STATE GENERATION AND ANNIHILATION IN SOI MOSFETS, IEEE electron device letters, 17(3), 1996, pp. 121-123

Authors: SUSKI W WOCHOWSKI K ZALESKI A MYDLARZ T
Citation: W. Suski et al., MAGNETIC-PROPERTIES OF UMNXAL12-X ALLOYS, Journal of alloys and compounds, 219, 1995, pp. 275-278

Authors: KACZOROWSKI D TROC R SHLYK L NOEL H ZALESKI A
Citation: D. Kaczorowski et al., ON A STUDY OF NOVEL URANIUM OXYTELLURIDE U4O4TE3, Journal of magnetism and magnetic materials, 144, 1995, pp. 1437-1438

Authors: SINHA SP ZALESKI A IOANNOU DE CAMPISI GJ HUGHES HL
Citation: Sp. Sinha et al., IN-DEPTH ANALYSIS OF OPPOSITE CHANNEL BASED CHARGE INJECTION IN SOI MOSFETS AND RELATED DEFECT CREATION AND ANNIHILATION, Microelectronic engineering, 28(1-4), 1995, pp. 383-386

Authors: ZALESKI A SINHA SP IOANNOU DE CAMPISI GJ HUGHES HL
Citation: A. Zaleski et al., OPPOSITE-CHANNEL-BASED CHARGE INJECTION IN SOI MOSFETS UNDER HOT-CARRIER STRESS, I.E.E.E. transactions on electron devices, 42(9), 1995, pp. 1697-1700

Authors: JANCZAK J KUBIAK R ZALESKI A OLEJNICZAK J
Citation: J. Janczak et al., ON BETA-PHASE DECOMPOSITION IN THE IN-SN BINARY-SYSTEM, Journal of alloys and compounds, 206(2), 1994, pp. 215-216

Authors: VLAKHOV ES NENKOV KA CISZEK M ZALESKI A DIMITRIEV YB
Citation: Es. Vlakhov et al., SUPERCONDUCTING AND MAGNETIC-PROPERTIES OF MELT-QUENCHED BI-2223 SUPERCONDUCTORS DOPED WITH PB AND TE, Physica. C, Superconductivity, 225(1-2), 1994, pp. 149-157

Authors: ZALESKI A
Citation: A. Zaleski, MARKOCKI,WLADYSLAW - IN-MEMORIAM, Journal of Information Recording Materials, 22(1), 1994, pp. 1-2

Authors: DANTON MC ZALESKI A NICHOLS WL OLSON JD
Citation: Mc. Danton et al., MONOCLONAL-ANTIBODIES TO PLATELET GLYCOPROTEINS IB AND IIB IIIA INHIBIT ADHESION OF PLATELETS TO PURIFIED SOLID-PHASE VON-WILLEBRAND-FACTOR/, The Journal of laboratory and clinical medicine, 124(2), 1994, pp. 274-282

Authors: SINHA SP ZALESKI A IOANNOU DE
Citation: Sp. Sinha et al., INVESTIGATION OF CARRIER GENERATION IN FULLY DEPLETED ENHANCEMENT ANDACCUMULATION-MODE SOI MOSFETS, I.E.E.E. transactions on electron devices, 41(12), 1994, pp. 2413-2416

Authors: JANCZAK J KUBIAK R ZALESKI A OLEJNICZAK J
Citation: J. Janczak et al., METALLIC CONDUCTIVITY AND PHASE-TRANSITION IN TL2PC, Chemical physics letters, 225(1-3), 1994, pp. 72-75

Authors: SUSKI W ZALESKI A BADURSKI D FOLCIK L WOCHOWSKI K SEIDEL B GEIBEL C STEGLICH F
Citation: W. Suski et al., MAGNETIC, ELECTRIC AND THERMAL-PROPERTIES OF UNI10SI2 AND UNI8CU2SI2 INTERMETALLICS, Journal of alloys and compounds, 198(1-2), 1993, pp. 120000005-120000007

Authors: ZALESKI A IOANNOU DE CAMPISI GJ HUGHES HL
Citation: A. Zaleski et al., SUCCESSIVE CHARGING DISCHARGING OF GATE OXIDES IN SOI MOSFETS BY SEQUENTIAL HOT-ELECTRON STRESSING OF FRONT BACK CHANNEL, IEEE electron device letters, 14(9), 1993, pp. 435-437

Authors: ZALESKI A IOANNOU DE CAMPISI GJ HUGHES HL
Citation: A. Zaleski et al., MECHANISMS OF HOT-CARRIER-INDUCED DEGRADATION OF SOI (SIMOX) MOSFETS, Microelectronic engineering, 22(1-4), 1993, pp. 403-406
Risultati: 1-19 |