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Citation: G. Verzellesi et al., PREDICTION OF IMPACT-IONIZATION-INDUCED SNAP-BACK IN ADVANCED SI N-P-N BJTS BY MEANS OF A NONLOCAL ANALYTICAL MODEL FOR THE AVALANCHE MULTIPLICATION FACTOR, I.E.E.E. transactions on electron devices, 40(12), 1993, pp. 2296-2300
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Citation: G. Verzellesi et al., NEW METHOD FOR EXTRACTING COLLECTOR SERIES RESISTANCE OF BIPOLAR-TRANSISTORS, Electronics Letters, 29(10), 1993, pp. 931-933
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