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Results: 1-14 |
Results: 14
Infrared optical properties of aged porous GaAs
Authors: Zangooie, S Schubert, M Tiwald, TE Woollam, JA
Citation: S. Zangooie et al., Infrared optical properties of aged porous GaAs, J MATER RES, 16(5), 2001, pp. 1241-1244
Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry
Authors: Wongmanerod, C Zangooie, S Arwin, H
Citation: C. Wongmanerod et al., Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry, APPL SURF S, 172(1-2), 2001, pp. 117-125
Optical and microstructural characterization of thin films of photochromicfulgides
Authors: Jansson, R Zangooie, S Kugler, T Arwin, H
Citation: R. Jansson et al., Optical and microstructural characterization of thin films of photochromicfulgides, J PHYS CH S, 62(7), 2001, pp. 1219-1228
Surface, pore morphology, and optical properties of porous 4H-SiC
Authors: Zangooie, S Arwin, H
Citation: S. Zangooie et H. Arwin, Surface, pore morphology, and optical properties of porous 4H-SiC, J ELCHEM SO, 148(6), 2001, pp. G297-G302
Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs
Authors: Zangooie, S Schubert, M Thompson, DW Woollam, JA
Citation: S. Zangooie et al., Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs, APPL PHYS L, 78(7), 2001, pp. 937-939
Infrared ellipsometry characterization of porous silicon Bragg reflectors
Authors: Zangooie, S Schubert, M Trimble, C Thompson, DW Woollam, JA
Citation: S. Zangooie et al., Infrared ellipsometry characterization of porous silicon Bragg reflectors, APPL OPTICS, 40(6), 2001, pp. 906-912
Self-organization in porous 6H-SiC
Authors: Zangooie, S Woollam, JA Arwin, H
Citation: S. Zangooie et al., Self-organization in porous 6H-SiC, J MATER RES, 15(9), 2000, pp. 1860-1863
Characterization of 3C-SiC by spectroscopic ellipsometry
Authors: Jansson, R Zangooie, S Arwin, H Jarrendahl, K
Citation: R. Jansson et al., Characterization of 3C-SiC by spectroscopic ellipsometry, PHYS ST S-B, 218(1), 2000, pp. R1-R2
Ellipsometric characterization of thin Porous GaAs layers formed in HF solutions
Authors: Zangooie, S Woollam, JA
Citation: S. Zangooie et Ja. Woollam, Ellipsometric characterization of thin Porous GaAs layers formed in HF solutions, J MAT SCI L, 19(24), 2000, pp. 2171-2173
Porous anodic 4H-SiC: Thickness dependent anisotropy in pore propagation and ellipsometric characterization
Authors: Zangooie, S Arwin, H
Citation: S. Zangooie et H. Arwin, Porous anodic 4H-SiC: Thickness dependent anisotropy in pore propagation and ellipsometric characterization, PHYS ST S-A, 182(1), 2000, pp. 213-219
Protein adsorption in thin porous silicon layers
Authors: Arwin, H Gavutis, M Gustafsson, J Schultzberg, M Zangooie, S Tengvall, P
Citation: H. Arwin et al., Protein adsorption in thin porous silicon layers, PHYS ST S-A, 182(1), 2000, pp. 515-520
Microstructural and infrared optical properties of electrochemically etched highly doped 4H-SiC
Authors: Zangooie, S Persson, POA Hilfiker, JN Hultman, L Arwin, H
Citation: S. Zangooie et al., Microstructural and infrared optical properties of electrochemically etched highly doped 4H-SiC, J APPL PHYS, 87(12), 2000, pp. 8497-8503
Investigation of optical anisotropy of refractive-index-profiled porous silicon employing generalized ellipsometry
Authors: Zangooie, S Jansson, R Arwin, H
Citation: S. Zangooie et al., Investigation of optical anisotropy of refractive-index-profiled porous silicon employing generalized ellipsometry, J MATER RES, 14(11), 1999, pp. 4167-4175
Ellipsometric characterization of anisotropic porous silicon Fabry-Perot filters and investigation of temperature effects on capillary condensation efficiency
Authors: Zangooie, S Jansson, R Arwin, H
Citation: S. Zangooie et al., Ellipsometric characterization of anisotropic porous silicon Fabry-Perot filters and investigation of temperature effects on capillary condensation efficiency, J APPL PHYS, 86(2), 1999, pp. 850-858
Risultati: 1-14 |