Authors:
Davis, RF
Gehrke, T
Linthicum, KJ
Rajagopal, P
Roskowski, AM
Zheleva, T
Preble, EA
Zorman, CA
Mehregany, M
Schwarz, U
Schuck, J
Grober, R
Citation: Rf. Davis et al., Review of pendeo-epitaxial growth and characterization of thin films of GaN and AlGaN alloys on 6H-SiC(0001) and Si(111) substrates, MRS I J N S, 6(14), 2001, pp. 1-16
Authors:
Grigull, S
Ishimaru, M
Nastasi, M
Zorman, CA
Mehregany, M
Citation: S. Grigull et al., On the stability of beta-SiC with respect to chemical disorder induced by irradiation with energetic particles, PHIL MAG L, 81(2), 2001, pp. 55-61
Authors:
Davis, RF
Gehrke, T
Linthicum, KJ
Zheleva, TS
Rajagopal, P
Zorman, CA
Mehregany, M
Citation: Rf. Davis et al., Pendeo-epitaxial growth and characterization of thin films of gallium nitride and related materials on SiC(0001) and si(111) substrates, Z METALLKUN, 92(2), 2001, pp. 163-166
Authors:
Davis, RF
Gehrke, T
Linthicum, KJ
Zheleva, TS
Preble, EA
Rajagopal, P
Zorman, CA
Mehregany, M
Citation: Rf. Davis et al., Pendeo-epitaxial growth of thin films of gallium nitride and related materials and their characterization, J CRYST GR, 225(2-4), 2001, pp. 134-140
Authors:
Davis, RF
Gehrke, T
Linthicum, KJ
Zheleva, TS
Rajagopal, P
Zorman, CA
Mehregany, M
Citation: Rf. Davis et al., Pendeo-epitaxial growth and characterization of GaN and related materials on (6H-SiC(0001) and Si(111) substrates, MRS I J N S, 5, 2000, pp. NIL_46-NIL_57
Citation: Ca. Zorman et al., An in situ heating study of hydrogen-containing adsorbates on polycrystalline diamond surfaces using elastic recoil detection, DIAM RELAT, 9(8), 2000, pp. 1518-1523
Citation: Aa. Yasseen et al., Surface micromachining of polycrystalline SiC films using microfabricated molds of SiO2 and polysilicon, J MICROEL S, 8(3), 1999, pp. 237-242
Authors:
Rajan, N
Mehregany, M
Zorman, CA
Stefanescu, S
Kicher, TP
Citation: N. Rajan et al., Fabrication and testing of micromachined silicon carbide and nickel fuel atomizers for gas turbine engines, J MICROEL S, 8(3), 1999, pp. 251-257
Citation: M. Mehregany et Ca. Zorman, SiC MEMS: opportunities and challenges for applications in harsh environments, THIN SOL FI, 356, 1999, pp. 518-524
Citation: Aa. Yasseen et al., Roughness reduction of 3C-SiC surfaces using SiC-based mechanical polishing slurries, J ELCHEM SO, 146(1), 1999, pp. 327-330