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Results: 1-10 |
Results: 10

Authors: Saiz, JM de la Pena, JL Gonzalez, F Moreno, F
Citation: Jm. Saiz et al., Detection and recognition of local defects in 1D structures, OPT COMMUN, 196(1-6), 2001, pp. 33-39

Authors: Gonzalez, F Videen, G Valle, PJ Saiz, JM de la Pena, JL Moreno, F
Citation: F. Gonzalez et al., Light scattering computational methods for particles on substrates, J QUAN SPEC, 70(4-6), 2001, pp. 383-393

Authors: Nebeker, BM de la Pena, JL Hirleman, ED
Citation: Bm. Nebeker et al., Comparisons of the discrete-dipole approximation and modified double interaction model methods to predict light scattering from small features on surfaces, J QUAN SPEC, 70(4-6), 2001, pp. 749-759

Authors: Garcia, N Guzman, J Riande, E Garcia, F de la Pena, JL Calle, P Jimeno, ML
Citation: N. Garcia et al., Influence of the stereochemical configuration on the radical polymerization of methacrylic monomers: cis- and trans-(2-cyclohexyl-1,3-dioxan-5-yl) methacrylates, J POL SC PC, 38(21), 2000, pp. 3883-3891

Authors: de la Pena, JL Saiz, JM Gonzalez, F
Citation: Jl. De La Pena et al., Profile of a fiber from backscattering measurements, OPTICS LETT, 25(23), 2000, pp. 1699-1701

Authors: de la Pena, JL Saiz, JM Valle, PJ Gonzalez, F Moreno, FF
Citation: Jl. De La Pena et al., Tracking scattering minima to size metallic particles on flat substrates, PART PART S, 16(3), 1999, pp. 113-118

Authors: de la Pena, JL Saiz, JM Videen, G Gonzalez, F Valle, PJ Moreno, F
Citation: Jl. De La Pena et al., Scattering from particles on surfaces: visibility factor and polydispersity, OPTICS LETT, 24(21), 1999, pp. 1451-1453

Authors: de la Pena, JL Gonzalez, F Saiz, JM Moreno, F Valle, PJ
Citation: Jl. De La Pena et al., Application of a double-interaction model to the backscattering from particulate surfaces, OPT ENG, 38(6), 1999, pp. 1017-1023

Authors: de la Pena, JL Saiz, JM Valle, PJ Gonzalez, F Moreno, F Videen, G
Citation: Jl. De La Pena et al., Enhanced backscatter from monodisperse contaminants on a substrate, J QUAN SPEC, 63(2-6), 1999, pp. 383-392

Authors: de la Pena, JL Gonzalez, F Saiz, JM Moreno, F Valle, PJ
Citation: Jl. De La Pena et al., Sizing particles on substrates: A general method for oblique incidence, J APPL PHYS, 85(1), 1999, pp. 432-438
Risultati: 1-10 |