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Results: 1-10 |
Results: 10
Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction
Authors: Sokolowski-Tinten, K von Hoegen, MH von der Linde, D Cavalleri, A Siders, CW Brown, FLH Leitner, DM Toth, C Squier, JA Bart, CPJ Wilson, KR Kammler, M
Citation: K. Sokolowski-tinten et al., Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast X-ray diffraction, J PHYS IV, 11(PR2), 2001, pp. 473-477
Ultrafast x-ray measurement of laser heating in semiconductors: Parametersdetermining the melting threshold - art. no. 193306
Authors: Cavalleri, A Siders, CW Rose-Petruck, C Jimenez, R Toth, C Squier, JA Barty, CPJ Wilson, KR Sokolowski-Tinten, K von Hoegen, MH von der Linde, D
Citation: A. Cavalleri et al., Ultrafast x-ray measurement of laser heating in semiconductors: Parametersdetermining the melting threshold - art. no. 193306, PHYS REV B, 6319(19), 2001, pp. 3306
Femtosecond x-ray measurement of ultrafast melting and large acoustic transients - art. no. 225701
Authors: Sokolowski-Tinten, K Blome, C Dietrich, C Tarasevitch, A von Hoegen, MH von der Linde, D Cavalleri, A Squier, J Kammler, M
Citation: K. Sokolowski-tinten et al., Femtosecond x-ray measurement of ultrafast melting and large acoustic transients - art. no. 225701, PHYS REV L, 8722(22), 2001, pp. 5701
Formation of hill and valley structures on Si(001) vicinal surfaces studied by spot-profile-analyzing LEED
Authors: Minoda, H Shimakura, T Yagi, K Heringdorf, FJMZ von Hoegen, MH
Citation: H. Minoda et al., Formation of hill and valley structures on Si(001) vicinal surfaces studied by spot-profile-analyzing LEED, PHYS REV B, 61(8), 2000, pp. 5672-5678
Hydrogen-induced domain-wall structure on Si(113)
Authors: Heringdorf, FJMZ Goldbach, H Gunter, HL von Hoegen, MH Dorna, V Kohler, U Henzler, M
Citation: Fjmz. Heringdorf et al., Hydrogen-induced domain-wall structure on Si(113), SURF SCI, 458(1-3), 2000, pp. 147-154
Anharmonic lattice dynamics in germanium measured with ultrafast x-ray diffraction
Authors: Cavalleri, A Siders, CW Brown, FLH Leitner, DM Toth, C Squier, JA Barty, CPJ Wilson, KR Sokolowski-Tinten, K von Hoegen, MH von der Linde, D Kammler, M
Citation: A. Cavalleri et al., Anharmonic lattice dynamics in germanium measured with ultrafast x-ray diffraction, PHYS REV L, 85(3), 2000, pp. 586-589
Interplay of surface morphology, strain relief, and surface stress during surfactant mediated epitaxy of Ge on Si
Authors: Zahl, P Kury, P von Hoegen, MH
Citation: P. Zahl et al., Interplay of surface morphology, strain relief, and surface stress during surfactant mediated epitaxy of Ge on Si, APPL PHYS A, 69(5), 1999, pp. 481-488
Gold-induced faceting on a Si(001) vicinal surface: Spot-profile-analyzingLEED and reflection-electron-microscopy study
Authors: Minoda, H Yagi, K Heringdorf, FJMZ Meier, A Kahler, D von Hoegen, MH
Citation: H. Minoda et al., Gold-induced faceting on a Si(001) vicinal surface: Spot-profile-analyzingLEED and reflection-electron-microscopy study, PHYS REV B, 59(3), 1999, pp. 2363-2375
Gold-induced faceting on an Si(hhm) surface (m/h=1.4-1.5) studied by spot profile analyzing low-energy electron diffraction
Authors: Minoda, H Shimakura, T Yagi, K Heringdorf, FJM von Hoegen, MH
Citation: H. Minoda et al., Gold-induced faceting on an Si(hhm) surface (m/h=1.4-1.5) studied by spot profile analyzing low-energy electron diffraction, SURF SCI, 432(1-2), 1999, pp. 69-80
Detection of nonthermal molting by ultrafast X-ray diffraction
Authors: Siders, CW Cavalleri, A Sokolowski-Tinten, K Toth, C Guo, T Kammler, M von Hoegen, MH Wilson, KR von der Linde, D Barty, CPJ
Citation: Cw. Siders et al., Detection of nonthermal molting by ultrafast X-ray diffraction, SCIENCE, 286(5443), 1999, pp. 1340-1342
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