AAAAAA
Results: 76-100/1427
Authors:
HUSER D
ROTHE H
Citation: D. Huser et H. Rothe, ROBUST AVERAGING OF SIGNALS FOR TRIANGULATION SENSORS, Measurement science & technology, 9(7), 1998, pp. 1017-1023
Authors:
DEMAREST FC
Citation: Fc. Demarest, HIGH-RESOLUTION, HIGH-SPEED, LOW DATA AGE UNCERTAINTY, HETERODYNE DISPLACEMENT MEASURING INTERFEROMETER ELECTRONICS, Measurement science & technology, 9(7), 1998, pp. 1024-1030
Authors:
DAI XL
SETA K
Citation: Xl. Dai et K. Seta, HIGH-ACCURACY ABSOLUTE DISTANCE MEASUREMENT BY MEANS OF WAVELENGTH SCANNING HETERODYNE INTERFEROMETRY, Measurement science & technology, 9(7), 1998, pp. 1031-1035
HIGH-ACCURACY LENGTH METROLOGY USING MULTIPLE-STAGE SWEPT-FREQUENCY INTERFEROMETRY WITH LASER-DIODES
Authors:
BARWOOD GP
GILL P
ROWLEY WRC
Citation: Gp. Barwood et al., HIGH-ACCURACY LENGTH METROLOGY USING MULTIPLE-STAGE SWEPT-FREQUENCY INTERFEROMETRY WITH LASER-DIODES, Measurement science & technology, 9(7), 1998, pp. 1036-1041
Authors:
RIEHLE F
Citation: F. Riehle, USE OF OPTICAL FREQUENCY STANDARDS FOR MEASUREMENTS OF DIMENSIONAL STABILITY, Measurement science & technology, 9(7), 1998, pp. 1042-1048
Authors:
FUJIMA I
IWASAKI S
SETA K
Citation: I. Fujima et al., HIGH-RESOLUTION DISTANCE METER USING OPTICAL-INTENSITY MODULATION AT 28 GHZ, Measurement science & technology, 9(7), 1998, pp. 1049-1052
Authors:
NEUGEBAUER M
Citation: M. Neugebauer, THE UNCERTAINTY OF DIAMETER CALIBRATIONS WITH THE COMPARATOR FOR DIAMETER AND FORM, Measurement science & technology, 9(7), 1998, pp. 1053-1058
Authors:
PROBST R
WITTEKOPF R
KRAUSE M
DANGSCHAT H
ERNST A
Citation: R. Probst et al., THE NEW PTB ANGLE COMPARATOR, Measurement science & technology, 9(7), 1998, pp. 1059-1066
Authors:
BOURNACHEV MN
FILATOV YV
KIRIANOV KE
LOUKIANOV DP
MEZENTSEV AF
PAVLOV PA
Citation: Mn. Bournachev et al., PRECISION ANGLE MEASUREMENT IN A DIFFRACTIONAL SPECTROMETER BY MEANS OF A RING LASER, Measurement science & technology, 9(7), 1998, pp. 1067-1071
Authors:
KUETGENS U
BECKER P
Citation: U. Kuetgens et P. Becker, X-RAY ANGLE INTERFEROMETRY - A PRACTICAL SET-UP FOR CALIBRATION IN THE MICRORAD RANGE WITH NANORAD RESOLUTION, Measurement science & technology, 9(7), 1998, pp. 1072-1075
Authors:
AKETAGAWA M
TAKADA K
KOBAYASHI K
TAKESHIMA N
NORO M
NAKAYAMA Y
Citation: M. Aketagawa et al., LENGTH MEASUREMENT USING A REGULAR CRYSTALLINE LATTICE AND A DUAL TUNNELING UNIT SCANNING TUNNELING MICROSCOPE IN A THERMO-STABILIZED CELL, Measurement science & technology, 9(7), 1998, pp. 1076-1081
Authors:
HASCHE K
HERRMANN K
POHLENZ F
THIELE K
Citation: K. Hasche et al., DETERMINATION OF THE GEOMETRY OF MICROHARDNESS INDENTERS WITH A SCANNING FORCE MICROSCOPE, Measurement science & technology, 9(7), 1998, pp. 1082-1086
Authors:
MELI F
THALMANN R
Citation: F. Meli et R. Thalmann, LONG-RANGE AFM PROFILER USED FOR ACCURATE PITCH MEASUREMENTS, Measurement science & technology, 9(7), 1998, pp. 1087-1092
Authors:
RUDZITIS J
PADAMANS V
BORDO E
HAYTHAM R
Citation: J. Rudzitis et al., RANDOM PROCESS MODEL OF ROUGH SURFACES CONTACT, Measurement science & technology, 9(7), 1998, pp. 1093-1097
Authors:
HAITJEMA H
ROSIELLE N
KOTTE G
STEIJAERT H
Citation: H. Haitjema et al., DESIGN AND CALIBRATION OF A PARALLEL-MOVING DISPLACEMENT GENERATOR FOR NANO-METROLOGY, Measurement science & technology, 9(7), 1998, pp. 1098-1104
Authors:
ABOUZEID A
WIESE P
Citation: A. Abouzeid et P. Wiese, INTERFEROMETER WITH A WAVELENGTH-TUNED DIODE-LASER FOR SURFACE PROFILOMETRY, Measurement science & technology, 9(7), 1998, pp. 1105-1110
Authors:
DOWNS MJ
FORBES AB
SIDDLE JE
Citation: Mj. Downs et al., THE VERIFICATION OF A HIGH-PRECISION 2-DIMENSIONAL POSITION MEASUREMENT SYSTEM, Measurement science & technology, 9(7), 1998, pp. 1111-1114
Authors:
AKETAGAWA M
TAKADA K
KON H
Citation: M. Aketagawa et al., CALIBRATION OF A LASER REFERENCE PLANE FOR LARGE-SCALE DIMENSIONAL FLATNESS MEASUREMENT, Measurement science & technology, 9(7), 1998, pp. 1115-1119
Authors:
HASSLERGROHNE W
BOSSE H
Citation: W. Hasslergrohne et H. Bosse, AN ELECTRON-OPTICAL METROLOGY SYSTEM FOR PATTERN PLACEMENT MEASUREMENTS, Measurement science & technology, 9(7), 1998, pp. 1120-1128
Authors:
KIM SW
CHO WJ
KIM BC
Citation: Sw. Kim et al., LATERAL-SHEARING INTERFEROMETER USING SQUARE PRISMS FOR OPTICAL-TESTING OF ASPHERIC LENSES, Measurement science & technology, 9(7), 1998, pp. 1129-1136
Authors:
PFEIFER T
MISCHO H
EVERTZ J
MANEKELLER S
Citation: T. Pfeifer et al., ERROR COMPENSATION BY MODEL-BASED INTERFEROMETRY, Measurement science & technology, 9(7), 1998, pp. 1137-1141
Authors:
JORDAN HJ
WEGNER M
TIZIANI H
Citation: Hj. Jordan et al., HIGHLY ACCURATE NONCONTACT CHARACTERIZATION OF ENGINEERING SURFACES USING CONFOCAL MICROSCOPY, Measurement science & technology, 9(7), 1998, pp. 1142-1151
Authors:
BECK JV
WOODBURY KA
Citation: Jv. Beck et Ka. Woodbury, INVERSE PROBLEMS AND PARAMETER-ESTIMATION - INTEGRATION OF MEASUREMENTS AND ANALYSIS, Measurement science & technology, 9(6), 1998, pp. 839-847
Authors:
GAVRUS A
MASSONI E
CHENOT JL
Citation: A. Gavrus et al., THE ANALYSIS OF INELASTIC BEHAVIOR FORMULATED AS AN INVERSE RHEOLOGICAL APPROACH, Measurement science & technology, 9(6), 1998, pp. 848-863
Authors:
EMERY AF
NENAROKOMOV AV
Citation: Af. Emery et Av. Nenarokomov, OPTIMAL EXPERIMENT DESIGN, Measurement science & technology, 9(6), 1998, pp. 864-876